Neuware - Interface characterization and control are critical in the design and manufacture of high quality advanced materials, particularly, for nanomaterials. This proceedings features papers on interface science and technology that provide a unique and state-of-the art perspective on interface characterization and control. Articles from scientists and engineers from 11 different countries address interface control, high temperature interfaces, nanoparticle design, nanotechnology, suspension control, novel processing, particulate materials, microstructure, and hot gas cleaning. This unique volume will serve as a valuable reference for scientists and engineers interested in interfaces, particulate materials, and nanotechnology.

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Detalles bibliogr�ficos

T�tulo: Characterization and Control of Interfaces for High Quality Advanced Materials
Editor: Wiley Apr 2003
Fecha de publicaci�n: 2003
Idioma: Ingl�s
ISBN 10: 1574981706
ISBN 13: 9781574981704
Encuadernaci�n: Taschenbuch
Estado: Neu

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Sinopsis

Interface characterization and control are critical in the design and manufacture of high quality advanced materials, particularly, for nanomaterials. This proceedings features papers on interface science and technology that provide a unique and state-of-the art perspective on interface characterization and control. Articles from scientists and engineers from 11 different countries address interface control, high temperature interfaces, nanoparticle design, nanotechnology, suspension control, novel processing, particulate materials, microstructure, and hot gas cleaning. This unique volume will serve as a valuable reference for scientists and engineers interested in interfaces, particulate materials, and nanotechnology.

Proceedings of the International Conference on ICCCI 2003, Kurashiki, Japan, 2003; Ceramic Transactions, Volume 146.

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Kevin Ewsuk is the editor of Characterization and Control of Interfaces for High Quality Advanced Materials, published by Wiley.

Kiyoshi Nogi is the editor of Characterization and Control of Interfaces for High Quality Advanced Materials, published by Wiley.

Markus Reiterer is the editor of Characterization and Control of Interfaces for High Quality Advanced Materials, published by Wiley.

Antoni Tomsia is the editor of Characterization and Control of Interfaces for High Quality Advanced Materials, published by Wiley.

S. Jill Glass is the editor of Characterization and Control of Interfaces for High Quality Advanced Materials, published by Wiley.

Rolf Waesche is the editor of Characterization and Control of Interfaces for High Quality Advanced Materials, published by Wiley.

Keizo Uematsu is the editor of Characterization and Control of Interfaces for High Quality Advanced Materials, published by Wiley.

Makio Naito is the editor of Characterization and Control of Interfaces for High Quality Advanced Materials, published by Wiley.

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