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Applied Scanning Probe Methods XI: Scanning Probe Microscopy Techniques (Hardcover)

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ISBN 10: 3540850368 / ISBN 13: 9783540850366
Nuevos Condición: New Encuadernación de tapa dura
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Descripción

Hardcover. The ability to accurately and reproducibly measure the properties and perf- mance characteristics of nanoscale materials, devices, and systems is a critical enabler for progre.Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability. 235 pages. 0.522. N° de ref. de la librería 9783540850366

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Detalles bibliográficos

Título: Applied Scanning Probe Methods XI: Scanning ...

Año de publicación: 2008

Encuadernación: Hardcover

Condición del libro:New

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Sinopsis:

The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. These volumes constitute a timely comprehensive overview of SPM applications. Real industrial applications are included.

Review:

From the reviews:

"Vol. XI contains contributions about recent developments in scanning probe microscopy techniques. ... The editors and their talented authors have been among the leaders in the study of probe methods. ... Each chapter captures both the excitement and the importance of the work and conclusions reported, and will make profitable reading for researchers at all experience levels. ... All the chapters are supported by extensive lists of references and beautifully illustrated and in color too, also along with graphs, equations etc." (Current Engineering Practice, 2009)

“The articles ... are written in sufficient detail, so that university students, researchers and engineers can understand the physics of the instruments, the design and construction of the devices and the cantilevers, the signal processing algorithms, and their use in imaging and the surface characterization of the specimens. ... SPM includes a variety of techniques, including scanning near-field optical microscopy, which has interesting applications ... . well-written and clearly illustrated. ... contain ample experimental data and significant discussion of limitations and artifacts.” (Barry R. Masters, Optics & Photonics News, September, 2009)

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