Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits de Lu Albert K. Roberts Gordon W.: New (2012)

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Print on Demand pp. 136 23:B&W 6 x 9 in or 229 x 152 mm Perfect Bound on White w/Gloss Lam.

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Detalles bibliogr�ficos

T�tulo: Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits
Editor: Springer
Fecha de publicaci�n: 2012
Idioma: Ingl�s
ISBN 10: 1461359929
ISBN 13: 9781461359920
Encuadernaci�n: Encuadernaci�n de tapa blanda
Estado: New

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Sinopsis

Analog Signal Generation for Built-In-Self-Test (BIST) of Mixed-Signal Integrated Circuits is a concise introduction to a powerful new signal generation technique.
The book begins with a brief introduction to the testing problem and a review of conventional signal generation techniques. The book then describes an oversampling-based oscillator capable of generating high-precision analog tones using a combination of digital logic and D/A conversion. These concepts are then extended to multi-tone testing schemes without introducing a severe hardware penalty. The concepts are extended further to encompass piece-wise linear waveforms such as square, triangular and sawtooth waves. Experimental results are presented to verify the ideas in each chapter and finally, conclusions are drawn. For those readers unfamiliar with delta-sigma modulation techniques, a brief introduction to this subject is also provided in an appendix.
The book is ideal for test engineers, researchers and circuits designers with an interest in IC testing methods.

Rese�a del editor

Analog Signal Generation for Built-In-Self-Test (BIST) of Mixed-Signal Integrated Circuits is a concise introduction to a powerful new signal generation technique.
The book begins with a brief introduction to the testing problem and a review of conventional signal generation techniques. The book then describes an oversampling-based oscillator capable of generating high-precision analog tones using a combination of digital logic and D/A conversion. These concepts are then extended to multi-tone testing schemes without introducing a severe hardware penalty. The concepts are extended further to encompass piece-wise linear waveforms such as square, triangular and sawtooth waves. Experimental results are presented to verify the ideas in each chapter and finally, conclusions are drawn. For those readers unfamiliar with delta-sigma modulation techniques, a brief introduction to this subject is also provided in an appendix.
The book is ideal for test engineers, researchers and circuits designers with an interest in IC testing methods.

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