Accelerated Life Testing of One-shot Devices (Hardcover)

Idioma: inglés

Editorial: John Wiley & Sons Inc, New York, 2021

1119664004 / 9781119664000

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Hardcover. Provides authoritative guidance on statistical analysis techniques and inferential methods for one-shot device life-testing Estimating the reliability of one-shot deviceselectro-expolsive devices, fire extinguishers, automobile airbags, and other units that perform their function only onceposes unique analytical challenges to conventional approaches. Due to how one-shot devices are censored, their precise failure times cannot be obtained from testing. The condition of a one-shot device can only be recorded at a specific inspection time, resulting in a lack of lifetime data collected in life-tests. Accelerated Life Testing of One-shot Devices: Data Collection and Analysis addresses the fundamental issues of statistical modeling based on data collected from accelerated life-tests of one-shot devices. The authors provide inferential methods and procedures for planning accelerated life-tests, and describe advanced statistical techniques to help reliability practitioners overcome estimation problems in the real world. Topics covered include likelihood inference, competing-risks models, one-shot devices with dependent components, model selection, and more. Enabling readers to apply the techniques to their own lifetime data and arrive at the most accurate inference possible, this practical resource: Provides expert guidance on comprehensive data analysis of one-shot devices under accelerated life-testsDiscusses how to design experiments for data collection from efficient accelerated life-tests while conforming to budget constraintsHelps readers develops optimal designs for constant-stress and step-stress accelerated life-tests, mainstream life-tests commonly used in reliability practiceIncludes R code in each chapter for readers to use in their own analyses of one-shot device testing dataFeatures numerous case studies and practical examples throughoutHighlights important issues, problems, and future research directions in reliability theory and practice Accelerated Life Testing of One-shot Devices: Data Collection and Analysis is essential reading for graduate students, researchers, and engineers working on accelerated life testing data analysis. This item is printed on demand. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability.…

N° de ref. del artículo 9781119664000

Título
Accelerated Life Testing of One-shot Devices (Hardcover)
Autor
Narayanaswamy Balakrishnan
Editorial
John Wiley & Sons Inc, New York
Año de publicación
2021
Estado
new
Encuadernación
Hardcover
Idioma
inglés
ISBN 10
1119664004
ISBN 13
9781119664000

CitiRetail

Stevenage, Reino Unido

Vendedor de 5 estrellas

Vendedor de IberLibro desde 29 de junio de 2022

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