ADVANCED MATHEMATICAL AND COMPUTATIONAL TOOLS IN METROLOGY AND TESTING XI (Advances in Mathematics for Applied Sciences)

Alistair B Forbes;Anna Chunovkina;Sascha Eichstadt;Nien-Fan Zhang;Franco Pavese

ISBN 10: 9813274298 ISBN 13: 9789813274297

Editorial: World Scientific Publishing Co, 2018

Idioma: Ingl�s

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Detalles bibliogr�ficos

T�tulo

ADVANCED MATHEMATICAL AND COMPUTATIONAL TOOLS IN METROLOGY AND TESTING XI (Advances in Mathematics for Applied Sciences)

Editor

World Scientific Publishing Co

Fecha de publicaci�n

2018

Idioma

Ingl�s

ISBN 10

9813274298

ISBN 13

9789813274297

Encuadernaci�n

hardcover

Estado

Very Good

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Sinopsis

This volume contains original, refereed contributions by researchers from institutions and laboratories across the world that are involved in metrology and testing. They were adapted from presentations made at the eleventh edition of the Advanced Mathematical and Computational Tools in Metrology and Testing conference held at the University of Strathclyde, Glasgow, in September 2017, organized by IMEKO Technical Committee 21, the National Physical Laboratory, UK, and the University of Strathclyde. The papers present new modeling approaches, algorithms and computational methods for analyzing data from metrology systems and for evaluation of the measurement uncertainty, and describe their applications in a wide range of measurement areas.

This volume is useful to all researchers, engineers and practitioners who need to characterize the capabilities of measurement systems and evaluate measurement data. Through the papers written by experts working in leading institutions, it covers the latest computational approaches and describes applications to current measurement challenges in engineering, environment and life sciences.

De la contraportada

This volume contains original, refereed contributions by researchers from institutions and laboratories across the world that are involved in metrology and testing. They were adopted from presentations made at the eleventh edition of the Advanced Mathematical and Computational Tools Metrology conference held at the University of Strathclyde, Glasgow, in September, organized by IMEKO Technical Committee 21, the National Physical Laboratory, UK, and the University of Strathclyde. The papers present new modeling approaches, algorithms and computational methods for analyzing data from metrology systems and evaluation measurement uncertainty, and describe their applications in a wide range of measurement areas.

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