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Progress in Nanoscale Characterization and Manipulation - Tapa blanda

Libro 213 de 227: Springer Tracts in Modern Physics
 
9789811304552: Progress in Nanoscale Characterization and Manipulation

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Sinopsis

Electron/Ion Optics.- Scanning Electron Microscopy.- Transmission Electron Microscopy.- Scanning Transmission Electron Microscopy (STEM).- Spectroscopy.- Aberration Corrected Transmission Electron Microscopy and Its Applications.- In situ TEM: Theory and Applications.- Helium Ion Microscopy.

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