Sinopsis
High-Speed Serial Interface (HSSI) devices have become widespread in communications, from the embedded to high-performance computing systems, and from on-chip to a wide haul. Testing of HSSIs has been a challenging topic because of signal integrity issues, long test time and the need of expensive instruments. Accelerating Test, Validation and Debug of High Speed Serial Interfaces provides innovative test and debug approaches and detailed instructions on how to arrive to practical test of modern high-speed interfaces.
Accelerating Test, Validation and Debug of High Speed Serial Interfaces first proposes a new algorithm that enables us to perform receiver test more than 1000 times faster. Then an under-sampling based transmitter test scheme is presented. The scheme can accurately extract the transmitter jitter and finish the whole transmitter test within 100ms, while the test usually takes seconds. The book also presents and external loopback-based testing scheme, where and FPGA-based BER tester and a novel jitter injection technique are proposed. These schemes can be applied to validate, test and debug HSSIs with data rate up to 12.5Gbps at a lower test cost than pure ATE solutions. In addition, the book introduces an efficieng scheme to implement high performance Gaussian noise generators, suitable for evaluating BER performance under noise conditions.
"Sinopsis" puede pertenecer a otra edición de este libro.
Acerca del autor
Yongquan Fan is a Senior Test Engineer in the High Performance Analog group at Texas Instruments. He had been a Senior Staff Engineer in the Storage Peripheral Group at LSI Corporation from 2003~2008. From 1991 to 2000, he worked for Sichuan Changhong Electronic Incorporation, China. Yongquan Fan obtained his Ph.D and MENG degree from McGill University, Canada and his BS from Beijing University of Aeronautics and Astronautics, China, all in Electrical Engineering.
Zeljko Zilic received his Ph. D. and M. Sc. from the University of Toronto, and his B. Eng. from University of Zagreb, Croatia. From 1996 till 1997 he worked for Lucent Microelectronics. He joined McGill University in 1998, where he is now an Associate Professor. Prof. Zilic has used a sabbatical leave in 2004/2005 to work with ST Microelectronics in Ottawa. He has received two Best Paper Awards and several honorary mentions from international conferences, as well as a national teaching award in Canada.
De la contraportada
High-Speed Serial Interface (HSSI) devices have become widespread in communications, from the embedded to high-performance computing systems, and from on-chip to a wide haul. Testing of HSSIs has been a challenging topic because of signal integrity issues, long test time and the need of expensive instruments. Accelerating Test, Validation and Debug of High Speed Serial Interfaces provides innovative test and debug approaches and detailed instructions on how to arrive to practical test of modern high-speed interfaces.
Accelerating Test, Validation and Debug of High Speed Serial Interfaces first proposes a new algorithm that enables us to perform receiver test more than 1000 times faster. Then an under-sampling based transmitter test scheme is presented. The scheme can accurately extract the transmitter jitter and finish the whole transmitter test within 100ms, while the test usually takes seconds. The book also presents and external loopback-based testing scheme, where and FPGA-based BER tester and a novel jitter injection technique are proposed. These schemes can be applied to validate, test and debug HSSIs with data rate up to 12.5Gbps at a lower test cost than pure ATE solutions. In addition, the book introduces an efficieng scheme to implement high performance Gaussian noise generators, suitable for evaluating BER performance under noise conditions.
"Sobre este título" puede pertenecer a otra edición de este libro.
Otras ediciones populares con el mismo título
Resultados de la búsqueda para Accelerating Test, Validation and Debug of High Speed...
Imagen de archivo
Accelerating Test, Validation and Debug of High Speed Serial Interfaces (eng)
Impresión bajo demandaLibrería: Brook Bookstore On Demand, Napoli, NA, Italia
Calificación del vendedor: 3 de 5 estrellas
Condición: new. Questo è un articolo print on demand. Nº de ref. del artículo: SJFNRQ1EKA
Comprar nuevo
EUR 86,24
Envío por EUR 5,50
Se envía de Italia a Estados Unidos de America
Se envía de Italia a Estados Unidos de America
Cantidad disponible: Más de 20 disponibles
Imagen del vendedor
Accelerating Test, Validation and Debug of High Speed Serial Interfaces
Publicado por
Springer Netherlands Okt 2014, 2014
ISBN 10: 9400789734
ISBN 13: 9789400789739
Nuevo
Taschenbuch
Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Alemania
Calificación del vendedor: 5 de 5 estrellas
Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -High-Speed Serial Interface (HSSI) devices have become widespread in communications, from the embedded to high-performance computing systems, and from on-chip to a wide haul. Testing of HSSIs has been a challenging topic because of signal integrity issues, long test time and the need of expensive instruments. Accelerating Test, Validation and Debug of High Speed Serial Interfaces provides innovative test and debug approaches and detailed instructions on how to arrive to practical test of modern high-speed interfaces.Accelerating Test, Validation and Debug of High Speed Serial Interfaces first proposes a new algorithm that enables us to perform receiver test more than 1000 times faster. Then an under-sampling based transmitter test scheme is presented. The scheme can accurately extract the transmitter jitter and finish the whole transmitter test within 100ms, while the test usually takes seconds. The book also presents and external loopback-based testing scheme, where and FPGA-based BER tester and a novel jitter injection technique are proposed. These schemes can be applied to validate, test and debug HSSIs with data rate up to 12.5Gbps at a lower test cost than pure ATE solutions. In addition, the book introduces an efficieng scheme to implement high performance Gaussian noise generators, suitable for evaluating BER performance under noise conditions. 208 pp. Englisch. Nº de ref. del artículo: 9789400789739
Comprar nuevo
EUR 106,99
Envío por EUR 23,00
Se envía de Alemania a Estados Unidos de America
Se envía de Alemania a Estados Unidos de America
Cantidad disponible: 2 disponibles
Imagen del vendedor
Accelerating Test, Validation and Debug of High Speed Serial Interfaces
Publicado por
Springer Netherlands, 2014
ISBN 10: 9400789734
ISBN 13: 9789400789739
Nuevo
Tapa blanda
Librería: moluna, Greven, Alemania
Calificación del vendedor: 5 de 5 estrellas
Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Detailed instructions on achieving practical test of modern high-speed interfacesSelf-contained, with the background and tutorial includedExplains statistical measures of confidence and the ways to arrive at themYongquan Fan. Nº de ref. del artículo: 11511056
Comprar nuevo
EUR 92,27
Envío por EUR 48,99
Se envía de Alemania a Estados Unidos de America
Se envía de Alemania a Estados Unidos de America
Cantidad disponible: Más de 20 disponibles
Imagen de archivo
Accelerating Test, Validation and Debug of High Speed.
Librería: Books Puddle, New York, NY, Estados Unidos de America
Calificación del vendedor: 4 de 5 estrellas
Condición: New. pp. 208. Nº de ref. del artículo: 26357310716
Comprar nuevo
EUR 143,11
Envío por EUR 3,44
Se envía dentro de Estados Unidos de America
Se envía dentro de Estados Unidos de America
Cantidad disponible: 4 disponibles
Imagen de archivo
Accelerating Test, Validation and Debug of High Speed.
Impresión bajo demandaLibrería: Majestic Books, Hounslow, Reino Unido
Calificación del vendedor: 4 de 5 estrellas
Condición: New. Print on Demand pp. 208. Nº de ref. del artículo: 356228899
Comprar nuevo
EUR 148,19
Envío por EUR 7,51
Se envía de Reino Unido a Estados Unidos de America
Se envía de Reino Unido a Estados Unidos de America
Cantidad disponible: 4 disponibles
Imagen de archivo
Accelerating Test, Validation and Debug of High Speed.
Impresión bajo demandaLibrería: Biblios, Frankfurt am main, HESSE, Alemania
Calificación del vendedor: 4 de 5 estrellas
Condición: New. PRINT ON DEMAND pp. 208. Nº de ref. del artículo: 18357310710
Comprar nuevo
EUR 149,39
Envío por EUR 9,95
Se envía de Alemania a Estados Unidos de America
Se envía de Alemania a Estados Unidos de America
Cantidad disponible: 4 disponibles
Imagen del vendedor
Accelerating Test, Validation and Debug of High Speed Serial Interfaces
Librería: preigu, Osnabrück, Alemania
Calificación del vendedor: 5 de 5 estrellas
Taschenbuch. Condición: Neu. Accelerating Test, Validation and Debug of High Speed Serial Interfaces | Yongquan Fan (u. a.) | Taschenbuch | xii | Englisch | 2014 | Springer | EAN 9789400789739 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu. Nº de ref. del artículo: 105054941
Comprar nuevo
EUR 95,15
Envío por EUR 70,00
Se envía de Alemania a Estados Unidos de America
Se envía de Alemania a Estados Unidos de America
Cantidad disponible: 5 disponibles
Imagen del vendedor
Accelerating Test, Validation and Debug of High Speed Serial Interfaces
Publicado por
Springer, Springer Okt 2014, 2014
ISBN 10: 9400789734
ISBN 13: 9789400789739
Nuevo
Taschenbuch
Librería: buchversandmimpf2000, Emtmannsberg, BAYE, Alemania
Calificación del vendedor: 5 de 5 estrellas
Taschenbuch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -High-Speed Serial Interface (HSSI) devices have become widespread in communications, from the embedded to high-performance computing systems, and from on-chip to a wide haul. Testing of HSSIs has been a challenging topic because of signal integrity issues, long test time and the need of expensive instruments. Accelerating Test, Validation and Debug of High Speed Serial Interfaces provides innovative test and debug approaches and detailed instructions on how to arrive to practical test of modern high-speed interfaces.Accelerating Test, Validation and Debug of High Speed Serial Interfaces first proposes a new algorithm that enables us to perform receiver test more than 1000 times faster. Then an under-sampling based transmitter test scheme is presented. The scheme can accurately extract the transmitter jitter and finish the whole transmitter test within 100ms, while the test usually takes seconds. The book also presents and external loopback-based testing scheme, where and FPGA-based BER tester and a novel jitter injection technique are proposed. These schemes can be applied to validate, test and debug HSSIs with data rate up to 12.5Gbps at a lower test cost than pure ATE solutions. In addition, the book introduces an efficieng scheme to implement high performance Gaussian noise generators, suitable for evaluating BER performance under noise conditions.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 208 pp. Englisch. Nº de ref. del artículo: 9789400789739
Comprar nuevo
EUR 106,99
Envío por EUR 60,00
Se envía de Alemania a Estados Unidos de America
Se envía de Alemania a Estados Unidos de America
Cantidad disponible: 1 disponibles
Imagen del vendedor
Accelerating Test, Validation and Debug of High Speed Serial Interfaces
Librería: AHA-BUCH GmbH, Einbeck, Alemania
Calificación del vendedor: 5 de 5 estrellas
Taschenbuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - High-Speed Serial Interface (HSSI) devices have become widespread in communications, from the embedded to high-performance computing systems, and from on-chip to a wide haul. Testing of HSSIs has been a challenging topic because of signal integrity issues, long test time and the need of expensive instruments. Accelerating Test, Validation and Debug of High Speed Serial Interfaces provides innovative test and debug approaches and detailed instructions on how to arrive to practical test of modern high-speed interfaces.Accelerating Test, Validation and Debug of High Speed Serial Interfaces first proposes a new algorithm that enables us to perform receiver test more than 1000 times faster. Then an under-sampling based transmitter test scheme is presented. The scheme can accurately extract the transmitter jitter and finish the whole transmitter test within 100ms, while the test usually takes seconds. The book also presents and external loopback-based testing scheme, where and FPGA-based BER tester and a novel jitter injection technique are proposed. These schemes can be applied to validate, test and debug HSSIs with data rate up to 12.5Gbps at a lower test cost than pure ATE solutions. In addition, the book introduces an efficieng scheme to implement high performance Gaussian noise generators, suitable for evaluating BER performance under noise conditions. Nº de ref. del artículo: 9789400789739
Comprar nuevo
EUR 112,77
Envío por EUR 61,62
Se envía de Alemania a Estados Unidos de America
Se envía de Alemania a Estados Unidos de America
Cantidad disponible: 1 disponibles
Imagen de archivo
Accelerating Test, Validation and Debug of High Speed Serial Interfaces
Librería: Revaluation Books, Exeter, Reino Unido
Calificación del vendedor: 5 de 5 estrellas
Paperback. Condición: Brand New. 2011 edition. 208 pages. 9.25x6.10x0.23 inches. In Stock. Nº de ref. del artículo: zk9400789734
Comprar nuevo
EUR 173,30
Envío por EUR 11,56
Se envía de Reino Unido a Estados Unidos de America
Se envía de Reino Unido a Estados Unidos de America
Cantidad disponible: 1 disponibles