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Handbook of Materials Testing Reactors and Associated Hot Laboratories in the European Community: Nuclear Science and Technology
Librería: The Secret Book and Record Store, Dublin, DUB, Irlanda
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Hardcover. Condición: As New. Slight shelf wear only. Otherwise, as new. Nº de ref. del artículo: HF007
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Handbook of Materials Testing Reactors and Associated Hot Laboratories in the European Community: Nuclear Science and Technology (Nuclear Science & Technology)
Librería: Mispah books, Redhill, SURRE, Reino Unido
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Handbook of Materials Testing Reactors and Associated Hot Laboratories in the European Community
Librería: J. HOOD, BOOKSELLERS, ABAA/ILAB, Baldwin City, KS, Estados Unidos de America
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Hardcover. 151pp. As new, clean, tight & bright condition. Nº de ref. del artículo: 187583
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Handbook of Materials Testing Reactors and Associated Hot Laboratories in the European Community
Impresión bajo demandaLibrería: moluna, Greven, Alemania
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Gebunden. Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Nº de ref. del artículo: 5814685
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Handbook of Materials Testing Reactors and Associated Hot Laboratories in the European Community: Nuclear Science and Technology
Librería: Ria Christie Collections, Uxbridge, Reino Unido
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Condición: New. In. Nº de ref. del artículo: ria9789027713476_new
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Handbook of Materials Testing Reactors and Associated Hot Laboratories in the European Community : Nuclear Science and Technology
Publicado por
Springer Netherlands, Springer Netherlands, 1981
ISBN 10: 9027713472
ISBN 13: 9789027713476
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Librería: AHA-BUCH GmbH, Einbeck, Alemania
Calificación del vendedor: 5 de 5 estrellas
Buch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - Estimating Device Reliability: Assessment of Credibility is concerned with the plausibility of reliability estimates obtained from statistical models. Statistical predictions are necessary because technology is always pushing into unexplored areas faster than devices can be made long-lived by design. Flawed reliability methodologies can produce disastrous results, an outstanding example of which is the catastrophic failure of the manned space shuttle CHALLENGER in January 1986. This issue is not whether, but which, statistical models should be used. The issue is not making reliability estimates, but is instead their credibility. The credibility questions explored in the context of practical applications include: What does the confidence level associated with the use of statistical model mean Is the numerical result associated with a high confidence level beyond dispute When is it appropriate to use the exponential (constant hazard rate) model Does this model always provide the most conservative reliability estimate Are the results of traditional 'random' failure hazard rate calculations tenable Are there persuasive alternatives What model should be used to describe the useful life of a device when wearout is absent When Weibull and lognormal failure plots containing a large number of failure times appear similar, how should the correct wearout model be selected Is it important to distinguish between a conservative upper bound on a probability of failure and a realistic estimate of the same probability Estimating Device Reliability: Assessment of Credibility is for those who are obliged to make reliability calculations with a paucity of somewhat corrupt data, by using inexact models, and by making physical assumptions which are impractical to verify. Illustrative examples deal with a variety of electronic devices, ICs and lasers. Nº de ref. del artículo: 9789027713476
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Handbook of Materials Testing Reactors and Associated Hot Laboratories in the European Community
Librería: Books Puddle, New York, NY, Estados Unidos de America
Calificación del vendedor: 4 de 5 estrellas
Condición: New. pp. 164. Nº de ref. del artículo: 263053330
Cantidad disponible: 4 disponibles
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Handbook of Materials Testing Reactors and Associated Hot Laboratories in the European Community
Publicado por
Springer Netherlands, Springer Netherlands Aug 1981, 1981
ISBN 10: 9027713472
ISBN 13: 9789027713476
Nuevo
Tapa dura
Librería: buchversandmimpf2000, Emtmannsberg, BAYE, Alemania
Calificación del vendedor: 5 de 5 estrellas
Buch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Estimating Device Reliability: Assessment of Credibility is concerned with the plausibility of reliability estimates obtained from statistical models. Statistical predictions are necessary because technology is always pushing into unexplored areas faster than devices can be made long-lived by design. Flawed reliability methodologies can produce disastrous results, an outstanding example of which is the catastrophic failure of the manned space shuttle CHALLENGER in January 1986. This issue is not whether, but which, statistical models should be used. The issue is not making reliability estimates, but is instead their credibility. The credibility questions explored in the context of practical applications include: What does the confidence level associated with the use of statistical model mean Is the numerical result associated with a high confidence level beyond dispute When is it appropriate to use the exponential (constant hazard rate) model Does this model always provide the most conservative reliability estimate Are the results of traditional 'random' failure hazard rate calculations tenable Are there persuasive alternatives What model should be used to describe the useful life of a device when wearout is absent When Weibull and lognormal failure plots containing a large number of failure times appear similar, how should the correct wearout model be selected Is it important to distinguish between a conservative upper bound on a probability of failure and a realistic estimate of the same probability Estimating Device Reliability: Assessment of Credibility is for those who are obliged to make reliability calculations with a paucity of somewhat corrupt data, by using inexact models, and by making physical assumptions which are impractical to verify. Illustrative examples deal with a variety of electronic devices, ICs and lasers.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 164 pp. Englisch. Nº de ref. del artículo: 9789027713476
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Handbook of Materials Testing Reactors and Associated Hot Laboratories in the European Community
Impresión bajo demandaLibrería: Majestic Books, Hounslow, Reino Unido
Calificación del vendedor: 5 de 5 estrellas
Condición: New. Print on Demand pp. 164 52:B&W 6.14 x 9.21in or 234 x 156mm (Royal 8vo) Case Laminate on White w/Gloss Lam. Nº de ref. del artículo: 5843149
Cantidad disponible: 4 disponibles
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Handbook of Materials Testing Reactors and Associated Hot Laboratories in the European Community
Publicado por
Springer Netherlands Aug 1981, 1981
ISBN 10: 9027713472
ISBN 13: 9789027713476
Nuevo
Tapa dura
Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Alemania
Calificación del vendedor: 5 de 5 estrellas
Buch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Estimating Device Reliability: Assessment of Credibility is concerned with the plausibility of reliability estimates obtained from statistical models. Statistical predictions are necessary because technology is always pushing into unexplored areas faster than devices can be made long-lived by design. Flawed reliability methodologies can produce disastrous results, an outstanding example of which is the catastrophic failure of the manned space shuttle CHALLENGER in January 1986. This issue is not whether, but which, statistical models should be used. The issue is not making reliability estimates, but is instead their credibility. The credibility questions explored in the context of practical applications include: What does the confidence level associated with the use of statistical model mean Is the numerical result associated with a high confidence level beyond dispute When is it appropriate to use the exponential (constant hazard rate) model Does this model always provide the most conservative reliability estimate Are the results of traditional 'random' failure hazard rate calculations tenable Are there persuasive alternatives What model should be used to describe the useful life of a device when wearout is absent When Weibull and lognormal failure plots containing a large number of failure times appear similar, how should the correct wearout model be selected Is it important to distinguish between a conservative upper bound on a probability of failure and a realistic estimate of the same probability Estimating Device Reliability: Assessment of Credibility is for those who are obliged to make reliability calculations with a paucity of somewhat corrupt data, by using inexact models, and by making physical assumptions which are impractical to verify. Illustrative examples deal with a variety of electronic devices, ICs and lasers. 164 pp. Englisch. Nº de ref. del artículo: 9789027713476
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