光电材料与器件测试评估技术 - Tapa blanda

Optoelectronic Materials and Devices. testing and evaluation techniques(Chinese Edition)

paperback. Condición: New. Language:Chinese.Pub Date: 2014-09-01 Pages: 192 Publisher: Zhengzhou University Press Optoelectronic Materials and Devices. testing and evaluation technology. according to W. E. Three-step model proposed by photoemission of Spicer. a detailed analysis of NEAGaN photocathode excited photoelectrons from the body to transport surface to escape through the surface barrier. the whole process of vacuum derived photoelectron tunneling cathode surface barrier transmission coefficient. By solving the. Nº de ref. del artículo: CQ063978

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