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Analysis of quality issues in test and appraisal of optoelectronic equipment(Chinese Edition) - Tapa blanda
Sinopsis
Language:Chinese.paperback.Pub Date:2024-05.publisher:Northwestern Polytechnical University Press.description:Paperback.Pub Date:2024-05 Pages:135 Language:Chinese Publisher:Northwestern Polytechnical University Press This book introduces the relevant content of quality problems in optoelectronic equipment test and appraisal. The book has five chapters. The
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- EditorialNorthwestern Polytechnical University Press
- Año de publicación2024
- ISBN 10 7561292643
- ISBN 13 9787561292648
- EncuadernaciónPaperback
- Contacto del fabricanteno disponible
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Analysis of quality issues in test and appraisal of optoelectronic equipment(Chinese Edition)
Publicado por
Northwestern Polytechnical University Press, 2024
ISBN 10: 7561292643
ISBN 13: 9787561292648
Nuevo
paperback
Librería: liu xing, Nanjing, JS, China
Calificación del vendedor: 5 de 5 estrellas
paperback. Condición: New. Paperback.Pub Date:2024-05 Pages:135 Language:Chinese Publisher:Northwestern Polytechnical University Press This book introduces the relevant content of quality problems in optoelectronic equipment test and appraisal. The book has five chapters. The first chapter introduces the concept of optoelectronic equipment test and appraisal. the classification of quality problems and the causes of quality problems. so that readers can have a general understanding of the quality problems of optoelectro. Nº de ref. del artículo: DR009451
Cantidad disponible: 3 disponibles