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Rietveld refinement of X-ray polycrystalline diffraction data and an introduction to GSAS software(Chinese Edition) - Tapa blanda
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Language:Chinese.paperback.Pub Date:2024-03.publisher:China Building Materials Industry Press.description:Paperback. Pub Date: 2024-03 Publisher: China Building Materials Industry Press The full spectrum fitting of the Rietveld method has become an important method for X-ray polycrystalline diffraction to correct crystal structure. This book consists of
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Rietveld refinement of X-ray polycrystalline diffraction data and an introduction to GSAS software(Chinese Edition)
Publicado por
China Building Materials Industry Press, 2024
ISBN 10: 7516040606
ISBN 13: 9787516040607
Nuevo
paperback
Librería: liu xing, Nanjing, JS, China
Calificación del vendedor: 5 de 5 estrellas
paperback. Condición: New. Language:Chinese.Paperback. Pub Date: 2024-03 Publisher: China Building Materials Industry Press The full spectrum fitting of the Rietveld method has become an important method for X-ray polycrystalline diffraction to correct crystal structure. This book consists of four chapters. focusing on introducing the principles of the Rietveld method and the basic process of refinement from operational examples. Chapter 1 briefly introduces the development overview and basic principles of the Rietveld. Nº de ref. del artículo: DS062221
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