Integrated Circuit Design and Integrated Systems -- Digital Integrated Circuit Testing and Design for Testability(Chinese Edition) - Tapa blanda

Integrated Circuit Design and Integrated Systems -- Digital Integrated Circuit Testing and Design for Testability(Chinese Edition)

paperback. Condición: New. Language:Chinese.Paperback. Pub Date: 2024-11 Pages: 190 Publisher: Chemical Industry Press This book starts with the basic concepts of digital integrated circuit testing and design for testability. systematically introducing the concepts. principles. and methods of digital integrated circuit testing. Main contents include: fundamentals of digital integrated circuit testing. test vector generation. design for testability and scan testing. boundary scan testing. built-in self-test. memory test. Nº de ref. del artículo: DT050125

Contactar al vendedor