Integrated Circuit Development and Test (Elementary)(Chinese Edition) - Tapa blanda

9787040553260: Integrated Circuit Development and Test (Elementary)(Chinese Edition)

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ISBN 10: 7040553260 ISBN 13: 9787040553260

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Idioma: Chino
ISBN 10: 7040553260
ISBN 13: 9787040553260
Encuadernaci�n: Tapa blanda
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Integrated Circuit Development and Test (Elementary)(Chinese Edition)

LV KUN YI . XIA . HANG ZHOU LANG XUN KE JI YOU XIAN GONG SI . ZU BIAN

Publicado por Higher Education Press, 2021

ISBN 10: 7040553260 ISBN 13: 9787040553260

Nuevo paperback

Librería: liu xing, Nanjing, JS, China

Calificaci�n del vendedor: 5 de 5 estrellas

paperback. Condici�n: New. Language:Chinese.Paperback.Pub Date:2021-01-01 Pages:232 Publisher:Higher Education Press This book is a supporting textbook for the 1+X vocational skill level certificate. corresponding to the integrated circuit development and testing vocational skill level certificate. covering the related primary certificate The field of work consists of 6 items: professional quality. wafer process. wafer testing. integrated circuit packaging. integrated circuit testing. and integrated circuit application. N� de ref. del art�culo: NX046001

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