I present some techniques to decrease the gate and other leakage dissipation in Deep Sub-Micron SRAM memories. This book reviews detail SRAM operations. This book also reviews various transistor intrinsic leakage mechanisms, including weak inversion, drain-induced barrier lowering, gate-induced drain leakage, and gate oxide tunneling. Finally, the book explores different circuit techniques to reduce the leakage power consumption. The W/L ratios are calculated from the equations of current in transistors (Linear and Saturation mode) for smooth read-write operation of both 0 and 1. I use W1/W3 = 1.5 and W4/W6 = 1.5. I first designed conventional SRAM memory and observed leakage current in various technology. In 90 nm technology conventional SRAM shows a leakage current of 1.87nA at steady state. Data retention gated-ground cache (DGR-cache) method reduces the leakage current to 100pA. Drowsy cache method reduces the leakage current to 84pA.
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Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -I present some techniques to decrease the gate and other leakage dissipation in Deep Sub-Micron SRAM memories. This book reviews detail SRAM operations. This book also reviews various transistor intrinsic leakage mechanisms, including weak inversion, drain-induced barrier lowering, gate-induced drain leakage, and gate oxide tunneling. Finally, the book explores different circuit techniques to reduce the leakage power consumption. The W/L ratios are calculated from the equations of current in transistors (Linear and Saturation mode) for smooth read-write operation of both 0 and 1. I use W1/W3 = 1.5 and W4/W6 = 1.5. I first designed conventional SRAM memory and observed leakage current in various technology. In 90 nm technology conventional SRAM shows a leakage current of 1.87nA at steady state. Data retention gated-ground cache (DGR-cache) method reduces the leakage current to 100pA. Drowsy cache method reduces the leakage current to 84pA. 68 pp. Englisch. Nº de ref. del artículo: 9786205517116
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Librería: AHA-BUCH GmbH, Einbeck, Alemania
Taschenbuch. Condición: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - I present some techniques to decrease the gate and other leakage dissipation in Deep Sub-Micron SRAM memories. This book reviews detail SRAM operations. This book also reviews various transistor intrinsic leakage mechanisms, including weak inversion, drain-induced barrier lowering, gate-induced drain leakage, and gate oxide tunneling. Finally, the book explores different circuit techniques to reduce the leakage power consumption. The W/L ratios are calculated from the equations of current in transistors (Linear and Saturation mode) for smooth read-write operation of both 0 and 1. I use W1/W3 = 1.5 and W4/W6 = 1.5. I first designed conventional SRAM memory and observed leakage current in various technology. In 90 nm technology conventional SRAM shows a leakage current of 1.87nA at steady state. Data retention gated-ground cache (DGR-cache) method reduces the leakage current to 100pA. Drowsy cache method reduces the leakage current to 84pA. Nº de ref. del artículo: 9786205517116
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Librería: moluna, Greven, Alemania
Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. I present some techniques to decrease the gate and other leakage dissipation in Deep Sub-Micron SRAM memories. This book reviews detail SRAM operations. This book also reviews various transistor intrinsic leakage mechanisms, including weak inversion, drain-. Nº de ref. del artículo: 778226850
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Librería: Books Puddle, New York, NY, Estados Unidos de America
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Librería: Majestic Books, Hounslow, Reino Unido
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Librería: Biblios, Frankfurt am main, HESSE, Alemania
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Librería: buchversandmimpf2000, Emtmannsberg, BAYE, Alemania
Taschenbuch. Condición: Neu. Neuware Books on Demand GmbH, Überseering 33, 22297 Hamburg 68 pp. Englisch. Nº de ref. del artículo: 9786205517116
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