Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Alemania
Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware 180 pp. Englisch. Nº de ref. del artículo: 9786200525383
Cantidad disponible: 2 disponibles
Librería: buchversandmimpf2000, Emtmannsberg, BAYE, Alemania
Taschenbuch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Software-Based Self-Test (SBST) has been researched extensively in industry and academia for more than three decades, yet automated self-test generation still lacks a suitable formal framework for modeling microprocessors. This book presents a methodology for formalizing and automating SBST synthesis, offering a new approach to microprocessor modeling and test generation.The book comprises four interconnected parts, covering the state of the art in SBST, modeling methods, microprocessor model synthesis, high-level fault modeling, test-data generation, and self-test program construction. It then develops methods for automating model and self-test program synthesis and concludes by integrating SBST programs into the testing flow of processor-centric boards.Designed for CAD and test engineers, researchers, and graduate students, the book also provides supplementary material for courses in computer architecture, digital-system testing, and design for testability.OmniScriptum SRL, Str. Armeneasca 28/1, office 1, 2012 Chisinau 180 pp. Englisch. Nº de ref. del artículo: 9786200525383
Cantidad disponible: 1 disponibles
Librería: AHA-BUCH GmbH, Einbeck, Alemania
Taschenbuch. Condición: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - Software-Based Self-Test (SBST) has been researched extensively in industry and academia for more than three decades, yet automated self-test generation still lacks a suitable formal framework for modeling microprocessors. This book presents a methodology for formalizing and automating SBST synthesis, offering a new approach to microprocessor modeling and test generation.The book comprises four interconnected parts, covering the state of the art in SBST, modeling methods, microprocessor model synthesis, high-level fault modeling, test-data generation, and self-test program construction. It then develops methods for automating model and self-test program synthesis and concludes by integrating SBST programs into the testing flow of processor-centric boards.Designed for CAD and test engineers, researchers, and graduate students, the book also provides supplementary material for courses in computer architecture, digital-system testing, and design for testability. Nº de ref. del artículo: 9786200525383
Cantidad disponible: 1 disponibles