Atomic force microscopy: Scanning probe microscopy, Scanning tunneling microscope, Heinrich Rohrer, IBM Research - Zurich, Piezoelectricity, Nanometre - Tapa blanda
Sinopsis
Please note that the content of this book primarily consists of articles available from Wikipedia or other free sources online. Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. The precursor to the AFM, the scanning tunneling microscope, was developed by Gerd Binnig and Heinrich Rohrer in the early 1980s at IBM Research - Zurich, a development that earned them the Nobel Prize for Physics in 1986. Binnig, Quate and Gerber invented the first atomic force microscope (also abbreviated as AFM) in 1986.
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Reseña del editor
Please note that the content of this book primarily consists of articles available from Wikipedia or other free sources online. Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. The precursor to the AFM, the scanning tunneling microscope, was developed by Gerd Binnig and Heinrich Rohrer in the early 1980s at IBM Research - Zurich, a development that earned them the Nobel Prize for Physics in 1986. Binnig, Quate and Gerber invented the first atomic force microscope (also abbreviated as AFM) in 1986.
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Atomic force microscopy
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Omniscriptum Mär 2026, 2026
ISBN 10: 6132722157
ISBN 13: 9786132722157
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Atomic force microscopy | Scanning probe microscopy, Scanning tunneling microscope, Heinrich Rohrer, IBM Research - Zurich, Piezoelectricity, Nanometre
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Taschenbuch. Condición: Neu. Atomic force microscopy | Scanning probe microscopy, Scanning tunneling microscope, Heinrich Rohrer, IBM Research - Zurich, Piezoelectricity, Nanometre | Frederic P. Miller (u. a.) | Taschenbuch | Englisch | 2026 | OmniScriptum | EAN 9786132722157 | Verantwortliche Person für die EU: preigu GmbH & Co. KG, Lengericher Landstr. 19, 49078 Osnabrück, mail[at]preigu[dot]de | Anbieter: preigu. Nº de ref. del artículo: 134657746
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Atomic force microscopy
Publicado por
Omniscriptum Mär 2026, 2026
ISBN 10: 6132722157
ISBN 13: 9786132722157
Nuevo
Taschenbuch
Librería: buchversandmimpf2000, Emtmannsberg, BAYE, Alemania
Calificación del vendedor: 5 de 5 estrellas
Taschenbuch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Please note that the content of this book primarily consists of articlesavailable from Wikipedia or other free sources online. Atomic forcemicroscopy (AFM) or scanning force microscopy (SFM) is a veryhigh-resolution type of scanning probe microscopy, with demonstratedresolution on the order of fractions of a nanometer, more than 1000times better than the optical diffraction limit. The precursor to theAFM, the scanning tunneling microscope, was developed by Gerd Binnig andHeinrich Rohrer in the early 1980s at IBM Research - Zurich, adevelopment that earned them the Nobel Prize for Physics in 1986.Binnig, Quate and Gerber invented the first atomic force microscope(also abbreviated as AFM) in 1986.VDM Verlag, Dudweiler Landstraße 99, 66123 Saarbrücken 72 pp. Englisch. Nº de ref. del artículo: 9786132722157
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Atomic force microscopy : Scanning probe microscopy, Scanning tunneling microscope, Heinrich Rohrer, IBM Research - Zurich, Piezoelectricity, Nanometre
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Taschenbuch. Condición: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - Please note that the content of this book primarily consists of articles available from Wikipedia or other free sources online. Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. The precursor to the AFM, the scanning tunneling microscope, was developed by Gerd Binnig and Heinrich Rohrer in the early 1980s at IBM Research - Zurich, a development that earned them the Nobel Prize for Physics in 1986. Binnig, Quate and Gerber invented the first atomic force microscope (also abbreviated as AFM) in 1986. Nº de ref. del artículo: 9786132722157
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