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Surface Roughness Study by Atomic Force Microscopy: Surface Roughness-Practical Example - Tapa blanda

Sayeed, Md.Abu; Ferdous, Zakia

 
9783848400355: Surface Roughness Study by Atomic Force Microscopy: Surface Roughness-Practical Example
Tapa blanda
ISBN 10: 3848400359 ISBN 13: 9783848400355
Editorial: LAP LAMBERT Academic Publishing, 2012

Sinopsis

AFM is becoming a key technique in many fields of nano-science and nano-technology. The AFM is capable of measuring nanometer scale images of insulating surfaces with thickness as well as measuring three dimensional images of surfaces and studying the topography. It is very suitable for biological system to determine substrate roughness analysis. The chitinous materials that mean microbiological matter are imaged for determining the surface roughness and interaction force of microbial surfaces by AFM.

"Sinopsis" puede pertenecer a otra edición de este libro.

Reseña del editor

AFM is becoming a key technique in many fields of nano-science and nano-technology. The AFM is capable of measuring nanometer scale images of insulating surfaces with thickness as well as measuring three dimensional images of surfaces and studying the topography. It is very suitable for biological system to determine substrate roughness analysis. The chitinous materials that mean microbiological matter are imaged for determining the surface roughness and interaction force of microbial surfaces by AFM.

Biografía del autor

Md.Abu Sayeed has completed his Bachelor of science in Electrical & Electronic Engineering from Khulna University of Engineering & Technology,Bangladesh.

"Sobre este título" puede pertenecer a otra edición de este libro.

Editorial
LAP LAMBERT Academic Publishing
Año de publicación
2012
Idioma
Inglés
ISBN 10 
3848400359
ISBN 13 
9783848400355
Encuadernación
Tapa blanda
Número de páginas
72
Contacto del fabricante
no disponible
Persona responsable
no disponible