The determination of the roughness of technical surfaces plays an important role in scientific and industrial applications. Traditionally, the ISO conform determination of the roughness of a technical surface has been calculated using contact stylus instruments. In contrast to this, it is presented two non-contact (optical) measurement devices, which are able to reconstruct 3D models of technical surfaces with a vertical resolution down to 20nm and allows measuring their roughness in this experimental study. All measured data that were obtained from a contact measurement instrument and two non-contact surface measuring systems have been evaluated by using SPSS 15 (Statistical Package for Social Science) statistically and two mathematical models giving the values of Ra and Rz parameters have been established. Precise measurement and evaluation processes of this book have been carried out "Nanotechnology Laboratory of the Department for Interchangeable Manufacturing and Industrial Metrology of Vienna University of Technology".
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The determination of the roughness of technical surfaces plays an important role in scientific and industrial applications. Traditionally, the ISO conform determination of the roughness of a technical surface has been calculated using contact stylus instruments. In contrast to this, it is presented two non-contact (optical) measurement devices, which are able to reconstruct 3D models of technical surfaces with a vertical resolution down to 20nm and allows measuring their roughness in this experimental study. All measured data that were obtained from a contact measurement instrument and two non-contact surface measuring systems have been evaluated by using SPSS 15 (Statistical Package for Social Science) statistically and two mathematical models giving the values of Ra and Rz parameters have been established. Precise measurement and evaluation processes of this book have been carried out "Nanotechnology Laboratory of the Department for Interchangeable Manufacturing and Industrial Metrology of Vienna University of Technology".
P?nar DEM?RC?O?LU, Assistant Professor, Mechanical Engineering Department, Adnan Menderes University. B.Sc. and M.Sc.: Studied Mechanical Engineering at Yildiz Technical University. Ph.D.: Studied Mechanical Engineering at Vienna University of Technology. The fields of study:Measurement and Quality Control, Nanotechnology.
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Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Alemania
Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The determination of the roughness of technical surfaces plays an important role in scientific and industrial applications. Traditionally, the ISO conform determination of the roughness of a technical surface has been calculated using contact stylus instruments. In contrast to this, it is presented two non-contact (optical) measurement devices, which are able to reconstruct 3D models of technical surfaces with a vertical resolution down to 20nm and allows measuring their roughness in this experimental study. All measured data that were obtained from a contact measurement instrument and two non-contact surface measuring systems have been evaluated by using SPSS 15 (Statistical Package for Social Science) statistically and two mathematical models giving the values of Ra and Rz parameters have been established. Precise measurement and evaluation processes of this book have been carried out 'Nanotechnology Laboratory of the Department for Interchangeable Manufacturing and Industrial Metrology of Vienna University of Technology'. 376 pp. Englisch. Nº de ref. del artículo: 9783838390215
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Taschenbuch. Condición: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - The determination of the roughness of technical surfaces plays an important role in scientific and industrial applications. Traditionally, the ISO conform determination of the roughness of a technical surface has been calculated using contact stylus instruments. In contrast to this, it is presented two non-contact (optical) measurement devices, which are able to reconstruct 3D models of technical surfaces with a vertical resolution down to 20nm and allows measuring their roughness in this experimental study. All measured data that were obtained from a contact measurement instrument and two non-contact surface measuring systems have been evaluated by using SPSS 15 (Statistical Package for Social Science) statistically and two mathematical models giving the values of Ra and Rz parameters have been established. Precise measurement and evaluation processes of this book have been carried out 'Nanotechnology Laboratory of the Department for Interchangeable Manufacturing and Industrial Metrology of Vienna University of Technology'. Nº de ref. del artículo: 9783838390215
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Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: DEMIRCIOGLU PINARPinar DEMIRCIOGLU, Assistant Professor, Mechanical Engineering Department, Adnan Menderes University. B.Sc. and M.Sc.: Studied Mechanical Engineering at Yildiz Technical University. Ph.D.: Studied Mechanical Engin. Nº de ref. del artículo: 5419261
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Taschenbuch. Condición: Neu. Comparison of Stylus and Optical Methods | Evaluation of High Precision Surface Structures and their Mathematical Modeling with the Help of Statistical Techniques | Pinar Dem¿Rc¿O¿Lu | Taschenbuch | 376 S. | Englisch | 2010 | LAP LAMBERT Academic Publishing | EAN 9783838390215 | Verantwortliche Person für die EU: preigu GmbH & Co. KG, Lengericher Landstr. 19, 49078 Osnabrück, mail[at]preigu[dot]de | Anbieter: preigu. Nº de ref. del artículo: 107421420
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Taschenbuch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -The determination of the roughness of technical surfaces plays an important role in scientific and industrial applications. Traditionally, the ISO conform determination of the roughness of a technical surface has been calculated using contact stylus instruments. In contrast to this, it is presented two non-contact (optical) measurement devices, which are able to reconstruct 3D models of technical surfaces with a vertical resolution down to 20nm and allows measuring their roughness in this experimental study. All measured data that were obtained from a contact measurement instrument and two non-contact surface measuring systems have been evaluated by using SPSS 15 (Statistical Package for Social Science) statistically and two mathematical models giving the values of Ra and Rz parameters have been established. Precise measurement and evaluation processes of this book have been carried out 'Nanotechnology Laboratory of the Department for Interchangeable Manufacturing and Industrial Metrology of Vienna University of Technology'.VDM Verlag, Dudweiler Landstraße 99, 66123 Saarbrücken 376 pp. Englisch. Nº de ref. del artículo: 9783838390215
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