Surface Analysis Methods in Materials Science - Tapa blanda

Sinopsis

1. Solid Surfaces, Their Structure and Composition.- 2. UHV Basics.- 3. Electron Microscope Techniques for Surface Characterization.- 4. Sputter Depth Profiling.- 5. SIMS - Secondary Ion Mass Spectrometry.- 6. Auger Spectroscopy and Scanning Auger Microscopy.- 7. X-Ray Photoelectron Spectroscopy.- 8. Fourier Transform Infrared Specroscopy of Surfaces.- 9. Rutherford Backscattering Spectrometry and Nuclear Reaction Analysis.- 10. Scanning Tunnelling Microscopy.- 11. Low Energy Ion Scattering.- 12. Reflection High Energy Electron Diffraction.- 13. Low Energy Electron Diffraction.- 14. Ultraviolet Photoelectron Spectroscopy of Solids.- 15. Spin Polarized Electron Techniques.- 16. Materials Technology.- 17. Characterization of Catalysts by Surface Analysis.- 18. Applications to Devices and Device Materials.- 19. Characterization of Oxidized Surfaces.- 20. Coated Steel.- 21. Thin Film Analysis.- 22. Identification of Adsorbed Species.- IV Appendix.- Acronyms Used in Surface and Thin Film Analysis.- Surface Science Bibliography.

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