Artículos relacionados a Testing of ASIC and FPGA circuits: VLSI testing and...

Testing of ASIC and FPGA circuits: VLSI testing and verification - Tapa blanda

Raj, Sumit

 
9783659275852: Testing of ASIC and FPGA circuits: VLSI testing and verification
Tapa blanda
ISBN 10: 3659275859 ISBN 13: 9783659275852
Editorial: LAP LAMBERT Academic Publishing, 2012

Sinopsis

This is my first book, related to my masters thesis work. In this book I have mentioned my research work on faster approach towards testing of VLSI design. This book is not limited to only my approach in testing, but whole ASIC and FPGA testing methods are given in brief. So this book can be used for general study related to VLSI testing. I hope this book enhance your knowledge in VLSI testing field.

"Sinopsis" puede pertenecer a otra edición de este libro.

Reseña del editor

This is my first book, related to my masters thesis work. In this book I have mentioned my research work on faster approach towards testing of VLSI design. This book is not limited to only my approach in testing, but whole ASIC and FPGA testing methods are given in brief. So this book can be used for general study related to VLSI testing. I hope this book enhance your knowledge in VLSI testing field.

Biografía del autor

I have done B.Tech in electornics and MS by research in VLSI testing from IIIT Hyderabad, India.Currently I am working for nVIDIA graphics as hardware engg in dft team.

"Sobre este título" puede pertenecer a otra edición de este libro.

Editorial
LAP LAMBERT Academic Publishing
Año de publicación
2012
Idioma
Inglés
ISBN 10 
3659275859
ISBN 13 
9783659275852
Encuadernación
Tapa blanda
Número de páginas
160
Contacto del fabricante
no disponible
Persona responsable
no disponible