The atomic force microscope (AFM) was originally utilised for its imaging capabilities. The full potential of the AFM as a three-dimensional force profiling instrument is only now being realised in an increasingly broad range of fields. One of the key requirements for AFM measurements is the quantification of both in-plane and out-of-plane forces acting between the tip and the sample. In this book the procedure for calibration and the various factors to consider when undertaking such studies is outlined with a focus on force-versus-distance and frictional measurements. Examples of surface property analyses, based on the quantification of forces, are shown, with examples ranging from living animal cells to polymeric materials.This book is designed for researchers and students who are interested in carrying out nano scale force measurements in the biological, physical and chemical sciences on a range of systems.
"Sinopsis" puede pertenecer a otra edición de este libro.
The atomic force microscope (AFM) was originally utilised for its imaging capabilities. The full potential of the AFM as a three-dimensional force profiling instrument is only now being realised in an increasingly broad range of fields. One of the key requirements for AFM measurements is the quantification of both in-plane and out-of-plane forces acting between the tip and the sample. In this book the procedure for calibration and the various factors to consider when undertaking such studies is outlined with a focus on force-versus-distance and frictional measurements. Examples of surface property analyses, based on the quantification of forces, are shown, with examples ranging from living animal cells to polymeric materials. This book is designed for researchers and students who are interested in carrying out nano scale force measurements in the biological, physical and chemical sciences on a range of systems.
"Sobre este título" puede pertenecer a otra edición de este libro.
Librería: GreatBookPrices, Columbia, MD, Estados Unidos de America
Condición: New. Nº de ref. del artículo: 5680107-n
Cantidad disponible: Más de 20 disponibles
Librería: PBShop.store US, Wood Dale, IL, Estados Unidos de America
PAP. Condición: New. New Book. Shipped from UK. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000. Nº de ref. del artículo: L0-9783639024616
Cantidad disponible: Más de 20 disponibles
Librería: Rarewaves.com USA, London, LONDO, Reino Unido
Paperback. Condición: New. Nº de ref. del artículo: LU-9783639024616
Cantidad disponible: Más de 20 disponibles
Librería: PBShop.store UK, Fairford, GLOS, Reino Unido
PAP. Condición: New. New Book. Delivered from our UK warehouse in 4 to 14 business days. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000. Nº de ref. del artículo: L0-9783639024616
Cantidad disponible: Más de 20 disponibles
Librería: Ria Christie Collections, Uxbridge, Reino Unido
Condición: New. In. Nº de ref. del artículo: ria9783639024616_new
Cantidad disponible: Más de 20 disponibles
Librería: Chiron Media, Wallingford, Reino Unido
Paperback. Condición: New. Nº de ref. del artículo: 6666-IUK-9783639024616
Cantidad disponible: 10 disponibles
Librería: GreatBookPricesUK, Woodford Green, Reino Unido
Condición: New. Nº de ref. del artículo: 5680107-n
Cantidad disponible: Más de 20 disponibles
Librería: moluna, Greven, Alemania
Condición: New. The atomic force microscope (AFM) was originally utilised for its imaging capabilities. The full potential of the AFM as a three-dimensional force profiling instrument is only now being realised in an increasingly broad range of fields. One of the key requi. Nº de ref. del artículo: 4950377
Cantidad disponible: Más de 20 disponibles
Librería: Rarewaves.com UK, London, Reino Unido
Book. Condición: New. Nº de ref. del artículo: LU-9783639024616
Cantidad disponible: Más de 20 disponibles
Librería: AHA-BUCH GmbH, Einbeck, Alemania
Taschenbuch. Condición: Neu. Neuware - The atomic force microscope (AFM) was originally utilised for its imaging capabilities. The full potential of the AFM as a three-dimensional force profiling instrument is only now being realised in an increasingly broad range of fields. One of the key requirements for AFM measurements is the quantification of both in-plane and out-of-plane forces acting between the tip and the sample. In this book the procedure for calibration and the various factors to consider when undertaking such studies is outlined with a focus on force-versus-distance and frictional measurements. Examples of surface property analyses, based on the quantification of forces, are shown, with examples ranging from living animal cells to polymeric materials. This book is designed for researchers and students who are interested in carrying out nano scale force measurements in the biological, physical and chemical sciences on a range of systems. Nº de ref. del artículo: 9783639024616
Cantidad disponible: 2 disponibles