Spectroscopy in Catalysis: An Introduction - Tapa dura

Sinopsis

Both textbook and monograph, "Spectroscopy in Catalysis" describes the most important modem analytical techniques used to investigate catalysts or related systems, such as thin films and single crystals that are used to model catalytic surfaces. These techniques include electron spectroscopic (XPS, UPS, AES, EELS), ion spectroscopics (SIMS, SNMS, RBS, LEIS), vibrational spectroscopies (infrared and Raman spectroscopy, EELS), mass spectroscopic and temperature programmed techniques (TPR, TPO, TDS), diffraction (XRD, LEED, EXAFS), and microscopy (TEM, SEM, STEM, STM, AFM, FEM and FIK. Like a monograph, it covers recent research. Like a textbook, it offers numerous graphics to explain the basics of each spectroscopic technique. Each chapter provides current applications to illustrate the type of information that the technique provides and evaluates the possibilities and limitations of the technique.

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