Characterization of Materials (v.2B) (Materials Science & Technology) - Tapa blanda

 
9783527282654: Characterization of Materials (v.2B) (Materials Science & Technology)

Sinopsis

A handbook, covering the field of materials science and technology, which considers both academic and industrial aspects. The detailed index makes the information in this reference text easily accessible. Every article also contains a list of symbols.

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Reseña del editor

This is the second of two volumes focusing on the principal analytical techniques for characterizing metal alloys, semiconductors, polymers, and ceramics. From the Contents: DiNardo: Scanning Tunneling Microscopy. De Batist: Mechanical Spectroscopy. Castle/Baker: Auger Electron Microscopy. Briggs: Quantitative Acoustic Microscopy. Exner: Quantitative Analysis of Microstructure. Lifshin: Electron Microprobe Analysis. Ma/Zhang/Chu/Liu: High Energy Ion Beam Analysis Techniques. Cerezo/Smith: Field Ion Microscopy and the Position Sensitive Atom Probe. Von Dreele: Neutron Diffraction. May/Williams/Guinier: Small-Angle Scattering of X-Rays and Neutrons

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Otras ediciones populares con el mismo título

9783527268153: Characterization of Materials (v. 2A) (Materials Science & Technology)

Edición Destacada

ISBN 10:  3527268154 ISBN 13:  9783527268153
Editorial: Wiley-VCH Verlag GmbH, 1992
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