This work is aimed towards the implementation of a fault-tolerant memory system with the help of supporting circuits. This work demonstrates an improvement on the reliability of a semiconductor memory system using Error control codes (ECC)and Low Density Parity Check (LDPC) Codes as a part of protecting support logic. It is observed that the error correcting codes with higher hamming distances can detect more errors i.e. as higher the hamming distance higher the error control capability.
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This work is aimed towards the implementation of a fault-tolerant memory system with the help of supporting circuits. This work demonstrates an improvement on the reliability of a semiconductor memory system using Error control codes (ECC)and Low Density Parity Check (LDPC) Codes as a part of protecting support logic. It is observed that the error correcting codes with higher hamming distances can detect more errors i.e. as higher the hamming distance higher the error control capability.
Asst.Prof.Poluboyina Lavanya and Assoc.Prof.Gobinda Prasad Acharya are upgrowing research scholars of JNTUK and JNTUH in the areas of wireless networks and VLSI testing respectively. N S Murti Sarma together with above are faculty of Sreenidhi Institute of Science and Technology. All the authors of the book are with significant credits of research.
"Sobre este título" puede pertenecer a otra edición de este libro.
Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Alemania
Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This work is aimed towards the implementation of a fault-tolerant memory system with the help of supporting circuits. This work demonstrates an improvement on the reliability of a semiconductor memory system using Error control codes (ECC)and Low Density Parity Check (LDPC) Codes as a part of protecting support logic. It is observed that the error correcting codes with higher hamming distances can detect more errors i.e. as higher the hamming distance higher the error control capability. 128 pp. Englisch. Nº de ref. del artículo: 9783330044197
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Librería: moluna, Greven, Alemania
Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: S. Murti Sarma N.Asst.Prof.Poluboyina Lavanya and Assoc.Prof.Gobinda Prasad Acharya are upgrowing research scholars of JNTUK and JNTUH in the areas of wireless networks and VLSI testing respectively. N S Murti Sarma together with abo. Nº de ref. del artículo: 158590434
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Librería: Revaluation Books, Exeter, Reino Unido
Paperback. Condición: Brand New. 128 pages. 8.66x5.91x0.29 inches. In Stock. Nº de ref. del artículo: 3330044195
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Librería: buchversandmimpf2000, Emtmannsberg, BAYE, Alemania
Taschenbuch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This work is aimed towards the implementation of a fault-tolerant memory system with the help of supporting circuits. This work demonstrates an improvement on the reliability of a semiconductor memory system using Error control codes (ECC)and Low Density Parity Check (LDPC) Codes as a part of protecting support logic. It is observed that the error correcting codes with higher hamming distances can detect more errors i.e. as higher the hamming distance higher the error control capability.VDM Verlag, Dudweiler Landstraße 99, 66123 Saarbrücken 128 pp. Englisch. Nº de ref. del artículo: 9783330044197
Cantidad disponible: 1 disponibles
Librería: Mispah books, Redhill, SURRE, Reino Unido
paperback. Condición: New. NEW. SHIPS FROM MULTIPLE LOCATIONS. book. Nº de ref. del artículo: ERICA82933300441956
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