Simulation of bit patterned media applied to data storage devices - Tapa blanda

Arbeláez Echeverri, Oscar David; Restrepo Parra, Elisabeth

 
9783330038462: Simulation of bit patterned media applied to data storage devices

Sinopsis

Bit patterned media is a promising candidate for the next generation of high density magnetic recording media, given its nano structure and special magnetic isolation properties, then new challenges arise in terms of construction and recording. In the present book we showcase how these challenges compare to the ones hindering the development of classical multi grain magnetic recording media and explore a way to relax the manufacturing quality requirements of this novel approach to magnetic recording.

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Reseña del editor

Bit patterned media is a promising candidate for the next generation of high density magnetic recording media, given its nano structure and special magnetic isolation properties, then new challenges arise in terms of construction and recording. In the present book we showcase how these challenges compare to the ones hindering the development of classical multi grain magnetic recording media and explore a way to relax the manufacturing quality requirements of this novel approach to magnetic recording.

Biografía del autor

Oscar David Arbeláez Echeverri, MSc. Physiscs, is a young researcher in computational physics, in his still short career he has made several contributions to the field of atomistic simulation of magnetic nano materials. Elisabeth Restrepo Parra, PhD., currently holds a full professor position in the Universidad Nacional de Colombia, she has made copious contributions to plasma physics and computational magnetism.

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