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Sinopsis
This book introduces readers to various radiation soft-error mechanisms such as soft delays, radiation induced clock jitter and pulses, and single event (SE) coupling induced effects. In addition to discussing various radiation hardening techniques for combinational logic, the author also describes new mitigation strategies targeting commercial designs. Coverage includes novel soft error mitigation techniques such as the Dynamic Threshold Technique and Soft Error Filtering based on Transmission gate with varied gate and body bias. The discussion also includes modeling of SE crosstalk noise, delay and speed-up effects. Various mitigation strategies to eliminate SE coupling effects are also introduced. Coverage also includes the reliability of low power energy-efficient designs and the impact of leakage power consumption optimizations on soft error robustness. The author presents an analysis of various power optimization techniques, enabling readers to make design choices that reduce static power consumption and improve soft error reliability at the same time.
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Acerca del autor
Dr. Selahattin Sayil is an Associate Professor in the Philip M. Drayer Department of Electrical Engineering at Lamar University. His research focuses on Radiation effects modeling and hardening at the circuit level, Reliability analysis of low power designs, and Interconnect modeling and noise prediction.
De la contraportada
This book introduces readers to various radiation soft-error mechanisms such as soft delays, radiation induced clock jitter and pulses, and single event (SE) coupling induced effects. In addition to discussing various radiation hardening techniques for combinational logic, the author also describes new mitigation strategies targeting commercial designs. Coverage includes novel soft error mitigation techniques such as the Dynamic Threshold Technique and Soft Error Filtering based on Transmission gate with varied gate and body bias. The discussion also includes modeling of SE crosstalk noise, delay and speed-up effects. Various mitigation strategies to eliminate SE coupling effects are also introduced. Coverage also includes the reliability of low power energy-efficient designs and the impact of leakage power consumption optimizations on soft error robustness. The author presents an analysis of various power optimization techniques, enabling readers to make design choices that reduce static power consumption and improve soft error reliability at the same time.
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Soft Error Mechanisms, Modeling and Mitigation
Publicado por
Springer International Publishing, 2016
ISBN 10: 3319306065
ISBN 13: 9783319306063
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Librería: Buchpark, Trebbin, Alemania
Calificación del vendedor: 5 de 5 estrellas
Condición: Sehr gut. Zustand: Sehr gut | Seiten: 120 | Sprache: Englisch | Produktart: Bücher. Nº de ref. del artículo: 26475726/12
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Soft Error Mechanisms, Modeling and Mitigation
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Springer International Publishing Mrz 2016, 2016
ISBN 10: 3319306065
ISBN 13: 9783319306063
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Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Alemania
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Buch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book introduces readers to various radiation soft-error mechanisms such as soft delays, radiation induced clock jitter and pulses, and single event (SE) coupling induced effects. In addition to discussing various radiation hardening techniques for combinational logic, the author also describes new mitigation strategies targeting commercial designs. Coverage includes novel soft error mitigation techniques such as the Dynamic Threshold Technique and Soft Error Filtering based on Transmission gate with varied gate and body bias. The discussion also includes modeling of SE crosstalk noise, delay and speed-up effects. Various mitigation strategies to eliminate SE coupling effects are also introduced. Coverage also includes the reliability of low power energy-efficient designs and the impact of leakage power consumption optimizations on soft error robustness. The author presents an analysis of various power optimization techniques, enabling readers to make design choices that reduce static power consumption and improve soft error reliability at the same time. 120 pp. Englisch. Nº de ref. del artículo: 9783319306063
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Soft Error Mechanisms, Modeling and Mitigation
Publicado por
Springer International Publishing, 2016
ISBN 10: 3319306065
ISBN 13: 9783319306063
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Librería: AHA-BUCH GmbH, Einbeck, Alemania
Calificación del vendedor: 5 de 5 estrellas
Buch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book introduces readers to various radiation soft-error mechanisms such as soft delays, radiation induced clock jitter and pulses, and single event (SE) coupling induced effects. In addition to discussing various radiation hardening techniques for combinational logic, the author also describes new mitigation strategies targeting commercial designs. Coverage includes novel soft error mitigation techniques such as the Dynamic Threshold Technique and Soft Error Filtering based on Transmission gate with varied gate and body bias. The discussion also includes modeling of SE crosstalk noise, delay and speed-up effects. Various mitigation strategies to eliminate SE coupling effects are also introduced. Coverage also includes the reliability of low power energy-efficient designs and the impact of leakage power consumption optimizations on soft error robustness. The author presents an analysis of various power optimization techniques, enabling readers to make design choices that reduce static power consumption and improve soft error reliability at the same time. Nº de ref. del artículo: 9783319306063
Cantidad disponible: 1 disponibles
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Soft Error Mechanisms, Modeling and Mitigation
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Soft Error Mechanisms, Modeling and Mitigation
Publicado por
Springer International Publishing, 2016
ISBN 10: 3319306065
ISBN 13: 9783319306063
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Librería: moluna, Greven, Alemania
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Gebunden. Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Introduces readers to various radiation soft-error mechanisms such as soft delays, radiation induced jitter and race, single event coupling noise, delay and speed-up effects and then compares coupling induced noise and delay effects to single event trans. Nº de ref. del artículo: 117107903
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Soft Error Mechanisms, Modeling and Mitigation
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Soft Error Mechanisms, Modeling and Mitigation
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Soft Error Mechanisms, Modeling and Mitigation
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Soft Error Mechanisms, Modeling and Mitigation
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Soft Error Mechanisms, Modeling and Mitigation
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Condición: As New. Unread book in perfect condition. Nº de ref. del artículo: 25734930
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