Artículos relacionados a Learning from VLSI Design Experience
Sinopsis
This book shares with readers practical design knowledge gained from the author’s 24 years of IC design experience. The author addresses issues and challenges faced commonly by IC designers, along with solutions and workarounds. Guidelines are described for tackling issues such as clock domain crossing, using lockup latch to cross clock domains during scan shift, implementation of scan chains across power domain, optimization methods to improve timing, how standard cell libraries can aid in synthesis optimization, BKM (best known method) for RTL coding, test compression, memory BIST, usage of signed Verilog for design requiring +ve and -ve calculations, state machine, code coverage and much more. Numerous figures and examples are provided to aid the reader in understanding the issues and their workarounds.
"Sinopsis" puede pertenecer a otra edición de este libro.
Acerca del autor
Weng Fook Lee is a distinguished Technical Director at Emerald Systems Design Center with 25 years of IC Design experience. Lee has vast experience in designing with Verilog and VHDL, and is an internationally acknowledged expert in the field of RTL coding and logic synthesis for ASIC/FPGA/SOC. Lee is an expert in synthesizing and tweaking synthesis for performance and low power, leading enhanced methodology to address advanced DFT techniques for VDSM technology, development and deployment of low power standard cell libraries. Lee have lead the development of new architectures and micro-architectures for efficient PMSM motion control ASIC and have developed architectures for AI classification algorithms implementation in ASIC. Lee published “VHDL Coding and Logic Synthesis with Synopsys" with Academic Press Publication, US (ISBN: 0-12-440651-3) in May 2000, "Verilog Coding for Logic Synthesis" with John Wiley Publication, US (ISBN: 0-471-42976-7) in April 2003, “VLIW Microprocessor Hardware Design for ASICs and FPGA” with McGraw Hill Publication, US (ISBN: 978-0071497022) in Aug 2007. Lee is also the inventor and co-inventor of 14 design patents granted by the US Patent and Trademark Office.
De la contraportada
This book shares with readers practical design knowledge gained from the author’s 24 years of IC design experience. The author addresses issues and challenges faced commonly by IC designers, along with solutions and workarounds. Guidelines are described for tackling issues such as clock domain crossing, using lockup latch to cross clock domains during scan shift, implementation of scan chains across power domain, optimization methods to improve timing, how standard cell libraries can aid in synthesis optimization, BKM (best known method) for RTL coding, test compression, memory BIST, usage of signed Verilog for design requiring +ve and -ve calculations, state machine, code coverage and much more. Numerous figures and examples are provided to aid the reader in understanding the issues and their workarounds.
- Addresses practical design issues and their workarounds;
- Discusses issues such as CDC, crossing clock domain in shift, scan chains across power domain, timing optimization, standard cell library influence on synthesis, DFT, code coverage, state machine;
- Provides readers with an RTL coding guideline, based on real experience.
"Sobre este título" puede pertenecer a otra edición de este libro.
EUR 18,00
EUR 30,00 gastos de envío desde Alemania a Estados Unidos de America
Destinos, gastos y plazos de envíoComprar nuevo
Ver este artículo
EUR 127,94
EUR 2,25 gastos de envío en Estados Unidos de America
Destinos, gastos y plazos de envíoResultados de la búsqueda para Learning from VLSI Design Experience
Imagen de archivo
Learning from VLSI Design Experience.
Publicado por
Cham, Springer., 2019
ISBN 10: 303003237X
ISBN 13: 9783030032371
Antiguo o usado
Tapa dura
Librería: Universitätsbuchhandlung Herta Hold GmbH, Berlin, Alemania
Calificación del vendedor: 5 de 5 estrellas
XXIX, 214 p. Hardcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. Sprache: Englisch. Nº de ref. del artículo: 4334CB
Gastos de envío:
EUR 30,00
De Alemania a Estados Unidos de America
Destinos, gastos y plazos de envío
Cantidad disponible: 2 disponibles
Imagen del vendedor
Learning from Vlsi Design Experience
Librería: GreatBookPrices, Columbia, MD, Estados Unidos de America
Calificación del vendedor: 5 de 5 estrellas
Condición: New. Nº de ref. del artículo: 33886292-n
Cantidad disponible: 15 disponibles
Imagen de archivo
Learning from VLSI Design Experience (Hardcover)
Publicado por
Springer Nature Switzerland AG, Cham, 2019
ISBN 10: 303003237X
ISBN 13: 9783030032371
Nuevo
Tapa dura
Librería: Grand Eagle Retail, Mason, OH, Estados Unidos de America
Calificación del vendedor: 5 de 5 estrellas
Hardcover. Condición: new. Hardcover. This book shares with readers practical design knowledge gained from the authors 24 years of IC design experience. The author addresses issues and challenges faced commonly by IC designers, along with solutions and workarounds. Guidelines are described for tackling issues such as clock domain crossing, using lockup latch to cross clock domains during scan shift, implementation of scan chains across power domain, optimization methods to improve timing, how standard cell libraries can aid in synthesis optimization, BKM (best known method) for RTL coding, test compression, memory BIST, usage of signed Verilog for design requiring +ve and -ve calculations, state machine, code coverage and much more. Numerous figures and examples are provided to aid the reader in understanding the issues and their workarounds. Shipping may be from multiple locations in the US or from the UK, depending on stock availability. Nº de ref. del artículo: 9783030032371
Cantidad disponible: 1 disponibles
Imagen de archivo
Learning from VLSI Design Experience
Librería: Lucky's Textbooks, Dallas, TX, Estados Unidos de America
Calificación del vendedor: 5 de 5 estrellas
Condición: New. Nº de ref. del artículo: ABLIING23Mar3113020003123
Cantidad disponible: Más de 20 disponibles
Imagen de archivo
Learning from VLSI Design Experience
Librería: Ria Christie Collections, Uxbridge, Reino Unido
Calificación del vendedor: 5 de 5 estrellas
Condición: New. In. Nº de ref. del artículo: ria9783030032371_new
Gastos de envío:
EUR 13,80
De Reino Unido a Estados Unidos de America
Destinos, gastos y plazos de envío
Cantidad disponible: Más de 20 disponibles
Imagen del vendedor
Learning from Vlsi Design Experience
Librería: GreatBookPrices, Columbia, MD, Estados Unidos de America
Calificación del vendedor: 5 de 5 estrellas
Condición: As New. Unread book in perfect condition. Nº de ref. del artículo: 33886292
Cantidad disponible: 15 disponibles
Imagen del vendedor
Learning from VLSI Design Experience
Publicado por
Springer International Publishing Feb 2019, 2019
ISBN 10: 303003237X
ISBN 13: 9783030032371
Nuevo
Tapa dura
Ejemplar firmado
Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Alemania
Calificación del vendedor: 5 de 5 estrellas
Buch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book shares with readers practical design knowledge gained from the author's 24 years of IC design experience. The author addresses issues and challenges faced commonly by IC designers, along with solutions and workarounds. Guidelines are described for tackling issues such as clock domain crossing, using lockup latch to cross clock domains during scan shift, implementation of scan chains across power domain, optimization methods to improve timing, how standard cell libraries can aid in synthesis optimization, BKM (best known method) for RTL coding, test compression, memory BIST, usage of signed Verilog for design requiring +ve and -ve calculations, state machine, code coverage and much more. Numerous figures and examples are provided to aid the reader in understanding the issues and their workarounds. 244 pp. Englisch. Nº de ref. del artículo: 9783030032371
Gastos de envío:
EUR 23,00
De Alemania a Estados Unidos de America
Destinos, gastos y plazos de envío
Cantidad disponible: 2 disponibles
Imagen del vendedor
Learning from VLSI Design Experience
Publicado por
Springer International Publishing, 2019
ISBN 10: 303003237X
ISBN 13: 9783030032371
Nuevo
Tapa dura
Librería: moluna, Greven, Alemania
Calificación del vendedor: 4 de 5 estrellas
Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Addresses practical design issues and their workaroundsDiscusses issues such as CDC, crossing clock domain in shift, scan chains across power domain, timing optimization, standard cell library influence on synthesis, DFT, code coverage, state mach. Nº de ref. del artículo: 246612281
Gastos de envío:
EUR 48,99
De Alemania a Estados Unidos de America
Destinos, gastos y plazos de envío
Cantidad disponible: Más de 20 disponibles
Imagen de archivo
Learning from VLSI Design Experience
Librería: Books Puddle, New York, NY, Estados Unidos de America
Calificación del vendedor: 4 de 5 estrellas
Condición: New. Nº de ref. del artículo: 26376774939
Cantidad disponible: 4 disponibles
Imagen de archivo
Learning from VLSI Design Experience
Impresión bajo demandaLibrería: Majestic Books, Hounslow, Reino Unido
Calificación del vendedor: 5 de 5 estrellas
Condición: New. Print on Demand. Nº de ref. del artículo: 369270468
Gastos de envío:
EUR 7,49
De Reino Unido a Estados Unidos de America
Destinos, gastos y plazos de envío
Cantidad disponible: 4 disponibles