Development of Methods for Characterisation of Roughness in Three Dimensions (Ultra Precision Technology Series) - Tapa blanda

Stout, Ken J; Blunt, Liam; Dong, W. P.; Mainsah, E.; Luo, N.; Mathia, T.; Sullivan, P. J.; Zahouani, H.

 
9781857180237: Development of Methods for Characterisation of Roughness in Three Dimensions (Ultra Precision Technology Series)
Tapa blanda
ISBN 10: 1857180232 ISBN 13: 9781857180237
Editorial: Penton Press, 2002

Sinopsis

Based on research funded by the European Commission, this important handbook provides a basis for a unified approach to three-dimensional surface finish assessment. It covers a broad range of issues related to 3-D micro-topography, with particular emphasis on standardisation, measurement, characterisation and interpretation. This reprint includes an updating introductory section. This work is to be the basis for a 3D international standard.

"Sinopsis" puede pertenecer a otra edición de este libro.

Acerca del autor

Professor Liam Blunt is Taylor Hobson Professor of Surface Metrology at the University of Huddersfield, UK. He is author of numerous published papers and other contributions on surface technology, and is co-author with Ken Stout of Three Dimensional Surface Topography (published by Penton Press, 2000).

"Sobre este título" puede pertenecer a otra edición de este libro.

Editorial
Penton Press
Año de publicación
2002
Idioma
Inglés
ISBN 10 
1857180232
ISBN 13 
9781857180237
Encuadernación
Tapa blanda
Número de páginas
384
Contacto del fabricante
no disponible
Persona responsable
no disponible