Artículos relacionados a Silicon Materials–Processing, Characterization...
Silicon Materials–Processing, Characterization and Reliability: Volume 716 (MRS Proceedings) - Tapa dura
Sinopsis
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
"Sinopsis" puede pertenecer a otra edición de este libro.
Reseña del editor
This book provides a solid look into the technical status of the semiconductor industry. The evolution of transistors to miniaturization beyond the capabilities of conventional IC processing has created a need for materials research in many levels of the integrated circuit fabrication, including new materials in substrates, gates and interconnects. The transition from silicon-based chemistries to alternative materials shows the unique properties of silicon that have permitted the dramatic progress in semiconductor device advancement in the past. New materials and techniques to process and evaluate materials will be required to extend device advancements, with the constraint of commercial viability. This book brings together the research and development to provide a view of the manufacturing industry. Topics include: silicon materials and processing; gate dielectrics and devices; high-k dielectrics; dielectric characterization; gate oxides and interfaces; metals and interfaces; characterization using surface analysis techniques; oxides and silicides; metals and modeling; low-k dielectrics and reliability.
Product Description
Silicon Materials-Processing V716 Hb editado por Cambridge
"Sobre este título" puede pertenecer a otra edición de este libro.
- EditorialCambridge University Press
- Año de publicación2002
- ISBN 10 1558996524
- ISBN 13 9781558996526
- EncuadernaciónTapa dura
- IdiomaInglés
- Número de páginas698
- EditorVeteran Janice L., O'Meara David L., Misra Veena, Ho Paul S.
- Contacto del fabricanteno disponible
EUR 17,84
EUR 33,02 gastos de envío desde Estados Unidos de America a España
Destinos, gastos y plazos de envío
Resultados de la búsqueda para Silicon Materials–Processing, Characterization...
Imagen de archivo
Silicon Materials-Processing, Characterization and Reliability: Volume 716 (MRS Proceedings) Veteran, Janice L.; O'Meara, David L.; Misra, Veena and Ho, Paul S.
Publicado por
Cambridge University Press, 2002
ISBN 10: 1558996524
ISBN 13: 9781558996526
Antiguo o usado
Tapa dura
Librería: CONTINENTAL MEDIA & BEYOND, Ocala, FL, Estados Unidos de America
Calificación del vendedor: 5 de 5 estrellas
Condición: Used: Good. 2002 hardcover no dj as issued xlibrary copy withdrawn stamp on edge of pages/ in book clean text vol 716 672 pages::: J-14. Nº de ref. del artículo: 0812IB66H31
Cantidad disponible: 1 disponibles