Materials Reliability Issues in Microelectronics: Volume 225 (MRS Proceedings) - Tapa dura

 
9781558991194: Materials Reliability Issues in Microelectronics: Volume 225 (MRS Proceedings)
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ISBN 10: 1558991190 ISBN 13: 9781558991194
Editorial: Cambridge University Press, 1991

Sinopsis

The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

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Reseña del editor

With the increased complexity of modern integrated circuits, it is important that reliability problems be attacked properly with the appropriate tools. This volume recognizes that almost all reliability problems are materials problems, and helps to put 'reliabilty physics' on a firm scientific foundation. Topics include: electromigration; stress effects on reliability; stress and packaging; metallization; device, oxide and dielectric reliability; new investigative techniques; corrosion.

Product Description

Book by None

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Editorial
Cambridge University Press
Año de publicación
1991
Idioma
Inglés
ISBN 10 
1558991190
ISBN 13 
9781558991194
Encuadernación
Tapa dura
Número de páginas
382
Editor
Lloyd James R., Yost Frederick G., Ho Paul S.
Contacto del fabricante
no disponible
Persona responsable
Avery
https://www.avery.fr/

chemin des peupliers 27
Dardilly
Francia

Otras ediciones populares con el mismo título

9781107409873: Materials Reliability Issues in Microelectronics: Volume 225 (MRS Proceedings)

Edición Destacada

ISBN 10:  110740987X ISBN 13:  9781107409873
Editorial: Cambridge University Press, 2014
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