Sinopsis
Excerpt from A Fortran Program for Analysis of Ellipsometer Measurements
Appendix I. Use of the aline Instruction in Relation to Alinement of the Ellipsometer.
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A Fortran Program for Analysis of Ellipsometer Measurements (Classic Reprint)
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Paperback. Condición: New. Print on Demand. This book is a general Fortran program that performs the calculations required to analyze ellipsometer measurements. The program can be used to analyze both single and multiple films on a surface, and it can also be used to calculate the optical constants of an absorbing film of given thickness. The program is based on the work of the author and other researchers, and it is designed to be accurate and easy to use. The book includes a detailed description of the theory behind the program, as well as instructions on how to use the program. This book is a valuable resource for anyone who is interested in using ellipsometry to characterize surfaces and thin films. This book is a reproduction of an important historical work, digitally reconstructed using state-of-the-art technology to preserve the original format. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in the book. print-on-demand item. Nº de ref. del artículo: 9781528120562_0
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A FORTRAN Program for Analysis of Ellipsometer Measurements (Classic Reprint)
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PAP. Condición: New. New Book. Shipped from UK. Established seller since 2000. Nº de ref. del artículo: LX-9781528120562
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A FORTRAN Program for Analysis of Ellipsometer Measurements (Classic Reprint)
Librería: PBShop.store UK, Fairford, GLOS, Reino Unido
Calificación del vendedor: 5 de 5 estrellas
PAP. Condición: New. New Book. Shipped from UK. Established seller since 2000. Nº de ref. del artículo: LX-9781528120562
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