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Sinopsis
Uncertainty in key parameters within a chip and between different chips in the deep sub micron area plays a more and more important role. As a result, manufacturing process spreads need to be considered during the design process. Quantitative methodology is needed to ensure faultless functionality, despite existing process variations within given bounds, during product development. This book presents the technological, physical, and mathematical fundamentals for a design paradigm shift, from a deterministic process to a probability-orientated design process for microelectronic circuits. Readers will learn to evaluate the different sources of variations in the design flow in order to establish different design variants, while applying appropriate methods and tools to evaluate and optimize their design.
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De la contraportada
Uncertainty in key parameters within a chip and between different chips in the deep sub micron era plays a more and more important role. As a result, manufacturing process spreads need to be considered during the design process. Quantitative methodology is needed to ensure faultless functionality, despite existing process variations within given bounds, during product development.
This book presents the technological, physical, and mathematical fundamentals for a design paradigm shift, from a deterministic process to a probability-orientated design process for microelectronic circuits. Readers will learn to evaluate the different sources of variations in the design flow in order to establish different design variants, while applying appropriate methods and tools to evaluate and optimize their design.
- Trains IC designers to recognize problems caused by parameter variations during manufacturing and to choose the best methods available to mitigate these issues during the design process;
- Offers both qualitative and quantitative insight into critical effects of process variation from perspectives of manufacturing, electronic design automation and circuit design;
- Describes critical effects of process variation using simple examples that can be reproduced by the reader.
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Process Variations and Probabilistic Integrated Circuit Design
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Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Trains IC designers to recognize problems caused by parameter variations during manufacturing and to choose the best methods available to mitigate these issues during the design process Offers both qualitative and quantitative insight into critical effects . Nº de ref. del artículo: 4212987
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Process Variations and Probabilistic Integrated Circuit Design
Librería: Ria Christie Collections, Uxbridge, Reino Unido
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Process Variations and Probabilistic Integrated Circuit Design
Publicado por
Springer New York Jan 2014, 2014
ISBN 10: 1489988602
ISBN 13: 9781489988607
Nuevo
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Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Alemania
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Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Uncertainty in key parameters within a chip and between different chips in the deep sub micron area plays a more and more important role. As a result, manufacturing process spreads need to be considered during the design process. Quantitative methodology is needed to ensure faultless functionality, despite existing process variations within given bounds, during product development.This book presents the technological, physical, and mathematical fundamentals for a design paradigm shift, from a deterministic process to a probability-orientated design process for microelectronic circuits. Readers will learn to evaluate the different sources of variations in the design flow in order to establish different design variants, while applying appropriate methods and tools to evaluate and optimize their design. 268 pp. Englisch. Nº de ref. del artículo: 9781489988607
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Process Variations and Probabilistic Integrated Circuit Design
Librería: GreatBookPrices, Columbia, MD, Estados Unidos de America
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Condición: New. Nº de ref. del artículo: 21689567-n
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Process Variations and Probabilistic Integrated Circuit Design
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Springer New York, Springer New York, 2014
ISBN 10: 1489988602
ISBN 13: 9781489988607
Nuevo
Taschenbuch
Librería: AHA-BUCH GmbH, Einbeck, Alemania
Calificación del vendedor: 5 de 5 estrellas
Taschenbuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - Uncertainty in key parameters within a chip and between different chips in the deep sub micron area plays a more and more important role. As a result, manufacturing process spreads need to be considered during the design process. Quantitative methodology is needed to ensure faultless functionality, despite existing process variations within given bounds, during product development.This book presents the technological, physical, and mathematical fundamentals for a design paradigm shift, from a deterministic process to a probability-orientated design process for microelectronic circuits. Readers will learn to evaluate the different sources of variations in the design flow in order to establish different design variants, while applying appropriate methods and tools to evaluate and optimize their design. Nº de ref. del artículo: 9781489988607
Cantidad disponible: 1 disponibles
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Process Variations and Probabilistic In (eng)
Impresión bajo demandaLibrería: Brook Bookstore On Demand, Napoli, NA, Italia
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Condición: new. Questo è un articolo print on demand. Nº de ref. del artículo: 8a66d8da2ce58cff77f96092b2c225b2
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Process Variations and Probabilistic Integrated Circuit Design
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Paperback. Condición: New. Nº de ref. del artículo: 6666-IUK-9781489988607
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Process Variations and Probabilistic Integrated Circuit Design
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Springer-Verlag New York Inc., 2014
ISBN 10: 1489988602
ISBN 13: 9781489988607
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Librería: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Irlanda
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Condición: New. Based on qualitative and quantitative insight, this volume presents the technological, physical, and mathematical fundamentals for a design paradigm shift for microelectronic circuits. The text explores design flow variations to establish different variants while optimizing the overall design. Editor(s): Dietrich, Manfred; Haase, Joachim. Num Pages: 252 pages, 32 black & white tables, biography. BIC Classification: TJFC; UGC. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 14. Weight in Grams: 415. . 2014. Paperback. . . . . Nº de ref. del artículo: V9781489988607
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Process Variations and Probabilistic Integrated Circuit Design
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Condición: As New. Unread book in perfect condition. Nº de ref. del artículo: 21689567
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Process Variations and Probabilistic Integrated Circuit Design
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Condición: New. pp. 268. Nº de ref. del artículo: 26127779729
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