Artículos relacionados a Process Variations and Probabilistic Integrated Circuit...
Sinopsis
Uncertainty in key parameters within a chip and between different chips in the deep sub micron area plays a more and more important role. As a result, manufacturing process spreads need to be considered during the design process. Quantitative methodology is needed to ensure faultless functionality, despite existing process variations within given bounds, during product development. This book presents the technological, physical, and mathematical fundamentals for a design paradigm shift, from a deterministic process to a probability-orientated design process for microelectronic circuits. Readers will learn to evaluate the different sources of variations in the design flow in order to establish different design variants, while applying appropriate methods and tools to evaluate and optimize their design.
"Sinopsis" puede pertenecer a otra edición de este libro.
De la contraportada
Uncertainty in key parameters within a chip and between different chips in the deep sub micron era plays a more and more important role. As a result, manufacturing process spreads need to be considered during the design process. Quantitative methodology is needed to ensure faultless functionality, despite existing process variations within given bounds, during product development.
This book presents the technological, physical, and mathematical fundamentals for a design paradigm shift, from a deterministic process to a probability-orientated design process for microelectronic circuits. Readers will learn to evaluate the different sources of variations in the design flow in order to establish different design variants, while applying appropriate methods and tools to evaluate and optimize their design.
- Trains IC designers to recognize problems caused by parameter variations during manufacturing and to choose the best methods available to mitigate these issues during the design process;
- Offers both qualitative and quantitative insight into critical effects of process variation from perspectives of manufacturing, electronic design automation and circuit design;
- Describes critical effects of process variation using simple examples that can be reproduced by the reader.
"Sobre este título" puede pertenecer a otra edición de este libro.
Comprar nuevo
Ver este artículo
EUR 92,27
EUR 19,49 gastos de envío desde Alemania a España
Destinos, gastos y plazos de envíoOtras ediciones populares con el mismo título
Resultados de la búsqueda para Process Variations and Probabilistic Integrated Circuit...
Imagen del vendedor
Process Variations and Probabilistic Integrated Circuit Design
Impresión bajo demandaLibrería: moluna, Greven, Alemania
Calificación del vendedor: 5 de 5 estrellas
Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Trains IC designers to recognize problems caused by parameter variations during manufacturing and to choose the best methods available to mitigate these issues during the design process Offers both qualitative and quantitative insight into critical effects . Nº de ref. del artículo: 4212987
Cantidad disponible: Más de 20 disponibles
Imagen del vendedor
Process Variations and Probabilistic Integrated Circuit Design
Publicado por
Springer New York Jan 2014, 2014
ISBN 10: 1489988602
ISBN 13: 9781489988607
Nuevo
Taschenbuch
Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Alemania
Calificación del vendedor: 5 de 5 estrellas
Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Uncertainty in key parameters within a chip and between different chips in the deep sub micron area plays a more and more important role. As a result, manufacturing process spreads need to be considered during the design process. Quantitative methodology is needed to ensure faultless functionality, despite existing process variations within given bounds, during product development.This book presents the technological, physical, and mathematical fundamentals for a design paradigm shift, from a deterministic process to a probability-orientated design process for microelectronic circuits. Readers will learn to evaluate the different sources of variations in the design flow in order to establish different design variants, while applying appropriate methods and tools to evaluate and optimize their design. 268 pp. Englisch. Nº de ref. del artículo: 9781489988607
Cantidad disponible: 2 disponibles
Imagen del vendedor
Process Variations and Probabilistic Integrated Circuit Design
Publicado por
Springer New York, Springer New York, 2014
ISBN 10: 1489988602
ISBN 13: 9781489988607
Nuevo
Taschenbuch
Librería: AHA-BUCH GmbH, Einbeck, Alemania
Calificación del vendedor: 5 de 5 estrellas
Taschenbuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - Uncertainty in key parameters within a chip and between different chips in the deep sub micron area plays a more and more important role. As a result, manufacturing process spreads need to be considered during the design process. Quantitative methodology is needed to ensure faultless functionality, despite existing process variations within given bounds, during product development.This book presents the technological, physical, and mathematical fundamentals for a design paradigm shift, from a deterministic process to a probability-orientated design process for microelectronic circuits. Readers will learn to evaluate the different sources of variations in the design flow in order to establish different design variants, while applying appropriate methods and tools to evaluate and optimize their design. Nº de ref. del artículo: 9781489988607
Cantidad disponible: 1 disponibles
Imagen de archivo
Process Variations and Probabilistic Integrated Circuit Design
Librería: Ria Christie Collections, Uxbridge, Reino Unido
Calificación del vendedor: 5 de 5 estrellas
Condición: New. In. Nº de ref. del artículo: ria9781489988607_new
Cantidad disponible: Más de 20 disponibles
Imagen de archivo
Process Variations and Probabilistic In (eng)
Impresión bajo demandaLibrería: Brook Bookstore On Demand, Napoli, NA, Italia
Calificación del vendedor: 5 de 5 estrellas
Condición: new. Questo è un articolo print on demand. Nº de ref. del artículo: 8a66d8da2ce58cff77f96092b2c225b2
Cantidad disponible: Más de 20 disponibles
Imagen de archivo
Process Variations and Probabilistic Integrated Circuit Design
Librería: Chiron Media, Wallingford, Reino Unido
Calificación del vendedor: 4 de 5 estrellas
Paperback. Condición: New. Nº de ref. del artículo: 6666-IUK-9781489988607
Cantidad disponible: 10 disponibles
Imagen del vendedor
Process Variations and Probabilistic Integrated Circuit Design
Publicado por
Springer New York, Springer US Jan 2014, 2014
ISBN 10: 1489988602
ISBN 13: 9781489988607
Nuevo
Taschenbuch
Librería: buchversandmimpf2000, Emtmannsberg, BAYE, Alemania
Calificación del vendedor: 5 de 5 estrellas
Taschenbuch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Uncertainty in key parameters within a chip and between different chips in the deep sub micron area plays a more and more important role. As a result, manufacturing process spreads need to be considered during the design process. Quantitative methodology is needed to ensure faultless functionality, despite existing process variations within given bounds, during product development.This book presents the technological, physical, and mathematical fundamentals for a design paradigm shift, from a deterministic process to a probability-orientated design process for microelectronic circuits. Readers will learn to evaluate the different sources of variations in the design flow in order to establish different design variants, while applying appropriate methods and tools to evaluate and optimize their design.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 268 pp. Englisch. Nº de ref. del artículo: 9781489988607
Cantidad disponible: 1 disponibles
Imagen de archivo
Process Variations and Probabilistic Integrated Circuit Design
Librería: Books Puddle, New York, NY, Estados Unidos de America
Calificación del vendedor: 4 de 5 estrellas
Condición: New. pp. 268. Nº de ref. del artículo: 26127779729
Cantidad disponible: 4 disponibles
Imagen de archivo
Process Variations and Probabilistic Integrated Circuit Design
Publicado por
Springer-Verlag New York Inc., 2014
ISBN 10: 1489988602
ISBN 13: 9781489988607
Nuevo
Paperback / softback
Librería: THE SAINT BOOKSTORE, Southport, Reino Unido
Calificación del vendedor: 5 de 5 estrellas
Paperback / softback. Condición: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days 445. Nº de ref. del artículo: C9781489988607
Cantidad disponible: Más de 20 disponibles
Imagen de archivo
Process Variations and Probabilistic Integrated Circuit Design
Impresión bajo demandaLibrería: Majestic Books, Hounslow, Reino Unido
Calificación del vendedor: 5 de 5 estrellas
Condición: New. Print on Demand pp. 268. Nº de ref. del artículo: 132807758
Cantidad disponible: 4 disponibles