Artículos relacionados a Electron Beam Testing Technology (Microdevices)
Sinopsis
Although exploratory and developmental activity in electron beam testing (EBT) 25 years, it was not had already been in existence in research laboratories for over until the beginning of the 1980s that it was taken up seriously as a technique for integrated circuit (IC) testing. While ICs were being fabricated on design rules of several microns, the mechanical ne edle probe served quite adequately for internal chip probing. This scenario changed with growing device complexity and shrinking geometries, prompting IC manufacturers to take note ofthis new testing technology. It required several more years and considerable investment by electron beam tester manufacturers, however, to co me up with user-friendly automated systems that were acceptable to IC test engineers. These intervening years witnessed intense activity in the development of instrumentation, testing techniques, and system automation, as evidenced by the proliferation of technical papers presented at conferences. With the shift of interest toward applications, the technology may now be considered as having come of age.
"Sinopsis" puede pertenecer a otra edición de este libro.
Reseña del editor
Although exploratory and developmental activity in electron beam testing (EBT) 25 years, it was not had already been in existence in research laboratories for over until the beginning of the 1980s that it was taken up seriously as a technique for integrated circuit (IC) testing. While ICs were being fabricated on design rules of several microns, the mechanical ne edle probe served quite adequately for internal chip probing. This scenario changed with growing device complexity and shrinking geometries, prompting IC manufacturers to take note ofthis new testing technology. It required several more years and considerable investment by electron beam tester manufacturers, however, to co me up with user-friendly automated systems that were acceptable to IC test engineers. These intervening years witnessed intense activity in the development of instrumentation, testing techniques, and system automation, as evidenced by the proliferation of technical papers presented at conferences. With the shift of interest toward applications, the technology may now be considered as having come of age.
Reseña del editor
This is the first comprehensive volume on electron beam testing for integrated circuits. Including introductory material, a guide to fundamentals, and an implementational section, the work will serve as a complete reference for both experienced practitioners as well as those unfamiliar with the technology.
"Sobre este título" puede pertenecer a otra edición de este libro.
Resultados de la búsqueda para Electron Beam Testing Technology (Microdevices)
Imagen de archivo
Electron Beam Testing Technology (eng)
Impresión bajo demandaLibrería: Brook Bookstore On Demand, Napoli, NA, Italia
Calificación del vendedor: 5 de 5 estrellas
Condición: new. Questo è un articolo print on demand. Nº de ref. del artículo: EPGEJJBAL6
Comprar nuevo
EUR 134,27
Envío por EUR 8,00
Se envía de Italia a Estados Unidos de America
Se envía de Italia a Estados Unidos de America
Cantidad disponible: Más de 20 disponibles
Imagen de archivo
Electron Beam Testing Technology (Microdevices)
Librería: Ria Christie Collections, Uxbridge, Reino Unido
Calificación del vendedor: 5 de 5 estrellas
Condición: New. In. Nº de ref. del artículo: ria9781489915245_new
Comprar nuevo
EUR 165,24
Envío por EUR 13,94
Se envía de Reino Unido a Estados Unidos de America
Se envía de Reino Unido a Estados Unidos de America
Cantidad disponible: Más de 20 disponibles
Imagen del vendedor
Electron Beam Testing Technology
Impresión bajo demandaLibrería: moluna, Greven, Alemania
Calificación del vendedor: 5 de 5 estrellas
Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Although exploratory and developmental activity in electron beam testing (EBT) 25 years, it was not had already been in existence in research laboratories for over until the beginning of the 1980s that it was taken up seriously as a technique for integrated. Nº de ref. del artículo: 4211711
Comprar nuevo
EUR 144,94
Envío por EUR 48,99
Se envía de Alemania a Estados Unidos de America
Se envía de Alemania a Estados Unidos de America
Cantidad disponible: Más de 20 disponibles
Imagen del vendedor
Electron Beam Testing Technology
Publicado por
Springer US Jun 2013, 2013
ISBN 10: 1489915249
ISBN 13: 9781489915245
Nuevo
Taschenbuch
Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Alemania
Calificación del vendedor: 5 de 5 estrellas
Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Although exploratory and developmental activity in electron beam testing (EBT) 25 years, it was not had already been in existence in research laboratories for over until the beginning of the 1980s that it was taken up seriously as a technique for integrated circuit (IC) testing. While ICs were being fabricated on design rules of several microns, the mechanical ne edle probe served quite adequately for internal chip probing. This scenario changed with growing device complexity and shrinking geometries, prompting IC manufacturers to take note ofthis new testing technology. It required several more years and considerable investment by electron beam tester manufacturers, however, to co me up with user-friendly automated systems that were acceptable to IC test engineers. These intervening years witnessed intense activity in the development of instrumentation, testing techniques, and system automation, as evidenced by the proliferation of technical papers presented at conferences. With the shift of interest toward applications, the technology may now be considered as having come of age. 480 pp. Englisch. Nº de ref. del artículo: 9781489915245
Comprar nuevo
EUR 171,19
Envío por EUR 23,00
Se envía de Alemania a Estados Unidos de America
Se envía de Alemania a Estados Unidos de America
Cantidad disponible: 2 disponibles
Imagen del vendedor
Electron Beam Testing Technology
Publicado por
Springer, Springer US, 2013
ISBN 10: 1489915249
ISBN 13: 9781489915245
Nuevo
Taschenbuch
Librería: AHA-BUCH GmbH, Einbeck, Alemania
Calificación del vendedor: 5 de 5 estrellas
Taschenbuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - Although exploratory and developmental activity in electron beam testing (EBT) 25 years, it was not had already been in existence in research laboratories for over until the beginning of the 1980s that it was taken up seriously as a technique for integrated circuit (IC) testing. While ICs were being fabricated on design rules of several microns, the mechanical ne edle probe served quite adequately for internal chip probing. This scenario changed with growing device complexity and shrinking geometries, prompting IC manufacturers to take note ofthis new testing technology. It required several more years and considerable investment by electron beam tester manufacturers, however, to co me up with user-friendly automated systems that were acceptable to IC test engineers. These intervening years witnessed intense activity in the development of instrumentation, testing techniques, and system automation, as evidenced by the proliferation of technical papers presented at conferences. With the shift of interest toward applications, the technology may now be considered as having come of age. Nº de ref. del artículo: 9781489915245
Comprar nuevo
EUR 185,59
Envío por EUR 30,50
Se envía de Alemania a Estados Unidos de America
Se envía de Alemania a Estados Unidos de America
Cantidad disponible: 1 disponibles
Imagen del vendedor
Electron Beam Testing Technology
Publicado por
Springer, Springer US Jun 2013, 2013
ISBN 10: 1489915249
ISBN 13: 9781489915245
Nuevo
Taschenbuch
Librería: buchversandmimpf2000, Emtmannsberg, BAYE, Alemania
Calificación del vendedor: 5 de 5 estrellas
Taschenbuch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Although exploratory and developmental activity in electron beam testing (EBT) 25 years, it was not had already been in existence in research laboratories for over until the beginning of the 1980s that it was taken up seriously as a technique for integrated circuit (IC) testing. While ICs were being fabricated on design rules of several microns, the mechanical ne edle probe served quite adequately for internal chip probing. This scenario changed with growing device complexity and shrinking geometries, prompting IC manufacturers to take note ofthis new testing technology. It required several more years and considerable investment by electron beam tester manufacturers, however, to co me up with user-friendly automated systems that were acceptable to IC test engineers. These intervening years witnessed intense activity in the development of instrumentation, testing techniques, and system automation, as evidenced by the proliferation of technical papers presented at conferences. With the shift of interest toward applications, the technology may now be considered as having come of age.Libri GmbH, Europaallee 1, 36244 Bad Hersfeld 480 pp. Englisch. Nº de ref. del artículo: 9781489915245
Comprar nuevo
EUR 171,19
Envío por EUR 60,00
Se envía de Alemania a Estados Unidos de America
Se envía de Alemania a Estados Unidos de America
Cantidad disponible: 1 disponibles
Imagen de archivo
Electron Beam Testing Technology (Microdevices)
Librería: Revaluation Books, Exeter, Reino Unido
Calificación del vendedor: 5 de 5 estrellas
Paperback. Condición: Brand New. reprint edition. 478 pages. 10.01x7.01x1.09 inches. In Stock. Nº de ref. del artículo: x-1489915249
Comprar nuevo
EUR 250,93
Envío por EUR 14,55
Se envía de Reino Unido a Estados Unidos de America
Se envía de Reino Unido a Estados Unidos de America
Cantidad disponible: 2 disponibles