Sinopsis
Foreword. Prface. 1. Introduction. 2. Digital CMOS Fault Modeling and Inductive Fault Analysis. 3. Defects in Logic Circuits and Their Test Implications. 4. Testing Defects in Sequential Circuits. 5. Defect Oriented RAM Testing and Current Testable RAMs. 6. Testing Defects in Programmable Logic Circuits. 7. Defect Oriented Analog Testing. 8. Conclusion. Index.
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