Soft Errors: From Particles to Circuits: 39 (Devices, Circuits, and Systems) - Tapa dura

Autran, Jean-Luc; Munteanu, Daniela

 
9781466590830: Soft Errors: From Particles to Circuits: 39 (Devices, Circuits, and Systems)
Tapa dura
ISBN 10: 1466590831 ISBN 13: 9781466590830
Editorial: CRC Press, 2015

Sinopsis

Soft errors are a multifaceted issue at the crossroads of applied physics and engineering sciences. Soft errors are by nature multiscale and multiphysics problems that combine not only nuclear and semiconductor physics, material sciences, circuit design, and chip architecture and operation, but also cosmic-ray physics, natural radioactivity issues, particle detection, and related instrumentation.

Soft Errors: From Particles to Circuits addresses the problem of soft errors in digital integrated circuits subjected to the terrestrial natural radiation environment―one of the most important primary limits for modern digital electronic reliability. Covering the fundamentals of soft errors as well as engineering considerations and technological aspects, this robust text:

  • Discusses the basics of the natural radiation environment, particle interactions with matter, and soft-error mechanisms
  • Details instrumentation developments in the fields of environment characterization, particle detection, and real-time and accelerated tests
  • Describes the latest computational developments, modeling, and simulation strategies for the soft error-rate estimation in digital circuits
  • Explores trends for future technological nodes and emerging devices

Soft Errors: From Particles to Circuits presents the state of the art of this complex subject, providing comprehensive knowledge of the complete chain of the physics of soft errors. The book makes an ideal text for introductory graduate-level courses, offers academic researchers a specialized overview, and serves as a practical guide for semiconductor industry engineers or application engineers.

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Acerca del autor

Jean-Luc Autran is distinguished professor of physics and electrical engineering at Aix-Marseille University and honorary member of the University Institute of France (IUF). He is also deputy director of the Institute for Materials, Microelectronics, and Nanosciences of Provence (IM2NP, UMR CNRS 7334) and the principal investigator of the Altitude Single-event effects Test European Platform (ASTEP). He is the author or coauthor of more than 300 papers published in international journals and conferences, a senior member of the Institute of Electrical and Electronics Engineers (IEEE), and a fellow of the Société de l’Electricité, de l’Electronique et des Technologies de l’Information et de la Communication (SEE).

Daniela Munteanu is director of research at the National Center for Scientific Research (CNRS). She is a fellow researcher at the Institute for Materials, Microelectronics, and Nanoscience of Provence (IM2NP, UMR CNRS 7334) and has 15 years of experience in characterization, modeling, and simulation of semiconductor devices. Her current research interests include emerging complementary-metal-oxide-semiconductor (CMOS) devices, compact modeling, numerical simulation in the domains of nanoelectronics, and radiation effects on components and circuits. She is also the author or coauthor of more than 200 papers published in international journals and conferences, and has supervised 12 Ph.D theses.

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Editorial
CRC Press
Año de publicación
2015
Idioma
Inglés
ISBN 10 
1466590831
ISBN 13 
9781466590830
Encuadernación
Tapa dura
Número de edición
1
Número de páginas
439
Contacto del fabricante
CRC Press
https://www.routledge-ny.com

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Estados Unidos de America
Persona responsable
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Otras ediciones populares con el mismo título

9780367655990: Soft Errors: From Particles to Circuits (Devices, Circuits, and Systems)

Edición Destacada

ISBN 10:  0367655993 ISBN 13:  9780367655990
Editorial: CRC Press, 2020
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