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Practical Materials Characterization - Tapa dura

 
9781461492801: Practical Materials Characterization
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ISBN 10: 1461492807 ISBN 13: 9781461492801
Editorial: Springer, 2014

Sinopsis

Practical Materials Characterization covers the most common materials analysis techniques in a single volume. It stands as a quick reference for experienced users, as a learning tool for students, and as a guide for the understanding of typical data interpretation for anyone looking at results from a range of analytical techniques. The book includes analytical methods covering microstructural, surface, morphological, and optical characterization of materials with emphasis on microscopic structural, electronic, biological, and mechanical properties. Many examples in this volume cover cutting-edge technologies such as nanomaterials and life sciences.

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Acerca del autor

Mauro Sardela (editor) is a Senior Research Scientist and Manager of the X-Ray Analysis Laboratory at the Frederick Seitz Materials Research Laboratory, University of Illinois at Urbana-Champaign. Dr. Sardela received his PhD in Material Science, in 1994, from the Institute of Physics of Materials, Linköping University, Sweden. He has authored and co-authored several publications in the area of x-ray scattering, materials analysis in general, with focus on semiconductors, complex oxides, nanomaterials, etc.

Judith E. Baker was a Senior Research Scientist at the Frederick Seitz Materials Research Laboratory, University of Illinois.  She began working with SIMS in the early 1970's and continued until she retired in 2003. Her collaborative efforts with researchers at the University of Illinois, other universities, and National Laboratories resulted in co-authorship of over 90 reviewed journal publications. Most of the publications include SIMS applications and involve a wide variety of materials.

Richard T. Haasch is a Senior Research Scientist and leader of the electron spectroscopy facilities at the Frederick Seitz Materials Research Laboratory, University of Illinois. He received a Ph.D. in analytical chemistry from the University of Minnesota in 1990. He has authored or co-authored over 90 publications and presentations in the area of surface analysis, materials characterization, and materials chemistry.

Julio A.N.T. Soares is a Senior Research Scientist and manager of the Laser and Spectroscopy facilities at the Frederick Seitz Materials Research Laboratory, University of Illinois. He received a Ph.D. in Solid State Physics from the University of Sao Paulo, Brazil, in 1997. He has authored or co-authored several publications and presentations in the area of optical characterization of materials.

Jianguo Wen is a Materials Scientist at Electron Microscopy Center, Argonne National Laboratory. He received his Ph.D. in condensed matter physics from Institute of Physics, Chinese Academy of Sciences in 1991. He is author or co-author of over 200 publications in peer-reviewed journals in the area of transmission electron microscopy, complex oxides, nanomaterials, Li-ion batteries, superconductors, and semiconductors. With total number of citations over 6500, 15 papers were cited over 100 times.

De la contraportada

This unique book covers the most common materials analysis techniques, such as transmission electron microscopy, x-ray diffraction and reflectivity, auger electron spectroscopy, secondary ion mass spectrometry, photoelectron spectroscopy, and several optical characterization methods. It stands as a quick reference for experienced users, as a learning tool for students, and as a guide for the understanding of typical data interpretation for anyone looking at results from a range of analytical techniques. The book includes analytical methods covering microstructural, surface, morphological, and optical characterization of materials with emphasis on microscopic structural, electronic, biological, and mechanical properties. Many examples in this volume cover cutting-edge technologies such as nanomaterials and life sciences.

This book also:

· Presents cross-comparison between materials characterization techniques, including x-ray diffraction and reflectivity, x-ray photoelectron spectroscopy, secondary ion mass spectrometery, ellipsometry, Raman spectroscopy, and more

· Includes clear specifications of strengths and limitations of each technique for specific materials characterization problem

· Focuses on applications and clear data interpretation without extensive mathematics

"Sobre este título" puede pertenecer a otra edición de este libro.

Editorial
Springer
Año de publicación
2014
Idioma
Inglés
ISBN 10 
1461492807
ISBN 13 
9781461492801
Encuadernación
Tapa dura
Número de páginas
237
Editor
Sardela Mauro
Contacto del fabricante
Springer Nature Customer Service Center GmbH
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