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Ion Spectroscopies for Surface Analysis: 2 (Methods of Surface Characterization) - Tapa blanda

 
9781461366492: Ion Spectroscopies for Surface Analysis: 2 (Methods of Surface Characterization)
Tapa blanda
ISBN 10: 1461366496 ISBN 13: 9781461366492
Editorial: Springer, 2012

Sinopsis

Determining the elemental composition of surfaces is an essential measurement in characterizing solid surfaces. At present, many ap proaches may be applied for measuring the elemental and molecular composition of a surface. Each method has particular strengths and limitations that often are directly connected to the physical processes involved. Typically, atoms and molecules on the surface and in the near surface region may be excited by photons, electrons, ions, or neutrals, and the detected particles are emitted, ejected, or scattered ions or electrons. The purpose of this book is to bring together a discussion of the surface compositional analysis that depends on detecting scattered or sputtered ions, and the methods emphasized are those where instruments are commercially available for carrying out the analysis. For each topic treated, the physical principles, instrumentation, qualitative analysis, artifacts, quantitative analysis, applications, opportunities, and limita tions are discussed. The first chapter provides an overview of the role of elemental composition in surface science; compositional depth profiling; stimulation by an electric field, electrons, neutrals, or photons and detection of ions; and then stimulation by ions, and detection of ions, electrons, photons, or neutrals.

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Reseña del editor

Determining the elemental composition of surfaces is an essential measurement in characterizing solid surfaces. At present, many ap­ proaches may be applied for measuring the elemental and molecular composition of a surface. Each method has particular strengths and limitations that often are directly connected to the physical processes involved. Typically, atoms and molecules on the surface and in the near surface region may be excited by photons, electrons, ions, or neutrals, and the detected particles are emitted, ejected, or scattered ions or electrons. The purpose of this book is to bring together a discussion of the surface compositional analysis that depends on detecting scattered or sputtered ions, and the methods emphasized are those where instruments are commercially available for carrying out the analysis. For each topic treated, the physical principles, instrumentation, qualitative analysis, artifacts, quantitative analysis, applications, opportunities, and limita­ tions are discussed. The first chapter provides an overview of the role of elemental composition in surface science; compositional depth profiling; stimulation by an electric field, electrons, neutrals, or photons and detection of ions; and then stimulation by ions, and detection of ions, electrons, photons, or neutrals.

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Editorial
Springer
Año de publicación
2012
Idioma
Inglés
ISBN 10 
1461366496
ISBN 13 
9781461366492
Encuadernación
Tapa blanda
Número de páginas
492
Editor
Czanderna Alvin W., Hercules David M.
Contacto del fabricante
Springer Nature Customer Service Center GmbH
ProductSafety@springernature.com

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