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Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits: 312 (The Springer International Series in Engineering and Computer Science) - Tapa blanda
Sinopsis
Analog Signal Generation for Built-In-Self-Test (BIST) of Mixed-Signal Integrated Circuits is a concise introduction to a powerful new signal generation technique.
The book begins with a brief introduction to the testing problem and a review of conventional signal generation techniques. The book then describes an oversampling-based oscillator capable of generating high-precision analog tones using a combination of digital logic and D/A conversion. These concepts are then extended to multi-tone testing schemes without introducing a severe hardware penalty. The concepts are extended further to encompass piece-wise linear waveforms such as square, triangular and sawtooth waves. Experimental results are presented to verify the ideas in each chapter and finally, conclusions are drawn. For those readers unfamiliar with delta-sigma modulation techniques, a brief introduction to this subject is also provided in an appendix.
The book is ideal for test engineers, researchers and circuits designers with an interest in IC testing methods.
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Analog Signal Generation for Built-In-Self-Test (BIST) of Mixed-Signal Integrated Circuits is a concise introduction to a powerful new signal generation technique.
The book begins with a brief introduction to the testing problem and a review of conventional signal generation techniques. The book then describes an oversampling-based oscillator capable of generating high-precision analog tones using a combination of digital logic and D/A conversion. These concepts are then extended to multi-tone testing schemes without introducing a severe hardware penalty. The concepts are extended further to encompass piece-wise linear waveforms such as square, triangular and sawtooth waves. Experimental results are presented to verify the ideas in each chapter and finally, conclusions are drawn. For those readers unfamiliar with delta-sigma modulation techniques, a brief introduction to this subject is also provided in an appendix.
The book is ideal for test engineers, researchers and circuits designers with an interest in IC testing methods.
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Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits
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Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Analog Signal Generation for Built-In-Self-Test (BIST) of Mixed-Signal Integrated Circuits is a concise introduction to a powerful new signal generation technique. The book begins with a brief introduction to the testing problem a. Nº de ref. del artículo: 4194202
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Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits (The Springer International Series in Engineering and Computer Science, 312)
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Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits
Librería: AHA-BUCH GmbH, Einbeck, Alemania
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Taschenbuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - Analog Signal Generation for Built-In-Self-Test (BIST) of Mixed-Signal Integrated Circuits is a concise introduction to a powerful new signal generation technique. The book begins with a brief introduction to the testing problem and a review of conventional signal generation techniques. The book then describes an oversampling-based oscillator capable of generating high-precision analog tones using a combination of digital logic and D/A conversion. These concepts are then extended to multi-tone testing schemes without introducing a severe hardware penalty. The concepts are extended further to encompass piece-wise linear waveforms such as square, triangular and sawtooth waves. Experimental results are presented to verify the ideas in each chapter and finally, conclusions are drawn. For those readers unfamiliar with delta-sigma modulation techniques, a brief introduction to this subject is also provided in an appendix. The book is ideal for test engineers, researchers and circuits designers with an interest in IC testing methods. Nº de ref. del artículo: 9781461359920
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Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits
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Springer-Verlag New York Inc., 2012
ISBN 10: 1461359929
ISBN 13: 9781461359920
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Paperback / softback. Condición: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days 221. Nº de ref. del artículo: C9781461359920
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Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits
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Springer US, Springer New York Sep 2012, 2012
ISBN 10: 1461359929
ISBN 13: 9781461359920
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Taschenbuch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Analog Signal Generation for Built-In-Self-Test (BIST) of Mixed-Signal Integrated Circuits is a concise introduction to a powerful new signal generation technique.The book begins with a brief introduction to the testing problem and a review of conventional signal generation techniques. The book then describes an oversampling-based oscillator capable of generating high-precision analog tones using a combination of digital logic and D/A conversion. These concepts are then extended to multi-tone testing schemes without introducing a severe hardware penalty. The concepts are extended further to encompass piece-wise linear waveforms such as square, triangular and sawtooth waves. Experimental results are presented to verify the ideas in each chapter and finally, conclusions are drawn. For those readers unfamiliar with delta-sigma modulation techniques, a brief introduction to this subject is also provided in an appendix.The book is ideal for test engineers, researchers and circuits designers with an interest in IC testing methods.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 136 pp. Englisch. Nº de ref. del artículo: 9781461359920
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Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits
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Condición: New. pp. 136 Index. Nº de ref. del artículo: 2697847006
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Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits (The Springer International Series in Engineering and Computer Science)
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Paperback. Condición: Brand New. 131 pages. 9.01x5.98x0.31 inches. In Stock. Nº de ref. del artículo: x-1461359929
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Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits
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Condición: New. Print on Demand pp. 136 23:B&W 6 x 9 in or 229 x 152 mm Perfect Bound on White w/Gloss Lam. Nº de ref. del artículo: 94550273
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Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits (The Springer International Series in Engineering and Computer Science, 312)
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Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits
Impresión bajo demandaLibrería: Biblios, Frankfurt am main, HESSE, Alemania
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Condición: New. PRINT ON DEMAND pp. 136. Nº de ref. del artículo: 1897846996
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