Artículos relacionados a Particles on Surfaces 2: Detection, Adhesion, and Removal
Reseña del editor
This volume documents the proceedings of the Second Symposium on Particles on Surfaces: Detection, Adhesion and Removal held as part of the 19th Annual Meeting of the Fine Particle Society in Santa Clara, California, July 20-25, 1988. The premier symposium on this topic was l organized in 1986 and has been properly chronicled . Based on the success of these two events and the high interest evinced by the technical community, we plan to regularly hold symposia on this topic on a biennial basis and the next one is slated for August 20-24, 1990 in San Diego, California. l As pointed out in the Preface to the first volume , the topic of particles on surfaces is of paramount importance in legion of technological areas. Particularly in the semiconductor device fabrication area, all signals indicate that the understanding of the behavior of particles on surfaces and their removal will attain heightened importance in the times to come. As the device dimensions are shrinking at an accelerated pace, so the benign particles of today will become the killer defects in the not too distant future. The tempo of research and development activity in the field of particles on surfaces is very high, and better and novel ways are continuously being devised to remove smaller and smaller particles.
Reseña del editor
Proceedings of the Second Symposium held in Santa Clara, California, July 18-22, 1988
"Sobre este título" puede pertenecer a otra edición de este libro.
- EditorialSpringer
- Año de publicación2011
- ISBN 10 146127852X
- ISBN 13 9781461278528
- EncuadernaciónTapa blanda
- IdiomaInglés
- Número de páginas340
- EditorMittal K.L.
EUR 100,43
EUR 29,37 gastos de envío desde Reino Unido a Estados Unidos de America
Destinos, gastos y plazos de envíoComprar nuevo
Ver este artículo
EUR 54,27
EUR 3,53 gastos de envío en Estados Unidos de America
Destinos, gastos y plazos de envíoOtras ediciones populares con el mismo título
Resultados de la búsqueda para Particles on Surfaces 2: Detection, Adhesion, and Removal
Imagen de archivo
Particles on Surfaces 2: Detection, Adhesion, and Removal
Librería: Lucky's Textbooks, Dallas, TX, Estados Unidos de America
Calificación del vendedor: 5 de 5 estrellas
Condición: New. Nº de ref. del artículo: ABLIING23Mar2716030029195
Cantidad disponible: Más de 20 disponibles
Imagen de archivo
Particles on Surfaces 2: Detection, Adhesion, and Removal
Librería: Ria Christie Collections, Uxbridge, Reino Unido
Calificación del vendedor: 5 de 5 estrellas
Condición: New. In. Nº de ref. del artículo: ria9781461278528_new
Gastos de envío:
EUR 14,07
De Reino Unido a Estados Unidos de America
Destinos, gastos y plazos de envío
Cantidad disponible: Más de 20 disponibles
Imagen de archivo
Particles on Surfaces 2: Detection, Adhesion, and Removal
Publicado por
Springer-Verlag New York Inc., 2011
ISBN 10: 146127852X
ISBN 13: 9781461278528
Nuevo
Paperback / softback
Librería: THE SAINT BOOKSTORE, Southport, Reino Unido
Calificación del vendedor: 5 de 5 estrellas
Paperback / softback. Condición: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days 570. Nº de ref. del artículo: C9781461278528
Gastos de envío:
EUR 14,63
De Reino Unido a Estados Unidos de America
Destinos, gastos y plazos de envío
Cantidad disponible: Más de 20 disponibles
Imagen del vendedor
Particles on Surfaces 2 : Detection, Adhesion, and Removal
Librería: AHA-BUCH GmbH, Einbeck, Alemania
Calificación del vendedor: 5 de 5 estrellas
Taschenbuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - This volume documents the proceedings of the Second Symposium on Particles on Surfaces: Detection, Adhesion and Removal held as part of the 19th Annual Meeting of the Fine Particle Society in Santa Clara, California, July 20-25, 1988. The premier symposium on this topic was l organized in 1986 and has been properly chronicled . Based on the success of these two events and the high interest evinced by the technical community, we plan to regularly hold symposia on this topic on a biennial basis and the next one is slated for August 20-24, 1990 in San Diego, California. l As pointed out in the Preface to the first volume , the topic of particles on surfaces is of paramount importance in legion of technological areas. Particularly in the semiconductor device fabrication area, all signals indicate that the understanding of the behavior of particles on surfaces and their removal will attain heightened importance in the times to come. As the device dimensions are shrinking at an accelerated pace, so the benign particles of today will become the killer defects in the not too distant future. The tempo of research and development activity in the field of particles on surfaces is very high, and better and novel ways are continuously being devised to remove smaller and smaller particles. Nº de ref. del artículo: 9781461278528
Gastos de envío:
EUR 30,93
De Alemania a Estados Unidos de America
Destinos, gastos y plazos de envío
Cantidad disponible: 1 disponibles
Imagen del vendedor
Particles on Surfaces 2
Impresión bajo demandaLibrería: moluna, Greven, Alemania
Calificación del vendedor: 5 de 5 estrellas
Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Proceedings of the Second Symposium held in Santa Clara, California, July 18-22, 1988 This volume documents the proceedings of the Second Symposium on Particles on Surfaces: Detection, Adhesion and Removal held as part of the 19th Annual Meeting of the. Nº de ref. del artículo: 4190444
Gastos de envío:
EUR 48,99
De Alemania a Estados Unidos de America
Destinos, gastos y plazos de envío
Cantidad disponible: Más de 20 disponibles
Imagen del vendedor
Particles on Surfaces 2
Publicado por
Springer US Okt 2011, 2011
ISBN 10: 146127852X
ISBN 13: 9781461278528
Nuevo
Taschenbuch
Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Alemania
Calificación del vendedor: 5 de 5 estrellas
Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This volume documents the proceedings of the Second Symposium on Particles on Surfaces: Detection, Adhesion and Removal held as part of the 19th Annual Meeting of the Fine Particle Society in Santa Clara, California, July 20-25, 1988. The premier symposium on this topic was l organized in 1986 and has been properly chronicled . Based on the success of these two events and the high interest evinced by the technical community, we plan to regularly hold symposia on this topic on a biennial basis and the next one is slated for August 20-24, 1990 in San Diego, California. l As pointed out in the Preface to the first volume , the topic of particles on surfaces is of paramount importance in legion of technological areas. Particularly in the semiconductor device fabrication area, all signals indicate that the understanding of the behavior of particles on surfaces and their removal will attain heightened importance in the times to come. As the device dimensions are shrinking at an accelerated pace, so the benign particles of today will become the killer defects in the not too distant future. The tempo of research and development activity in the field of particles on surfaces is very high, and better and novel ways are continuously being devised to remove smaller and smaller particles. 340 pp. Englisch. Nº de ref. del artículo: 9781461278528
Gastos de envío:
EUR 23,00
De Alemania a Estados Unidos de America
Destinos, gastos y plazos de envío
Cantidad disponible: 2 disponibles
Imagen de archivo
Particles on Surfaces 2: Detection, Adhesion, and Removal
Librería: Mispah books, Redhill, SURRE, Reino Unido
Calificación del vendedor: 4 de 5 estrellas
Paperback. Condición: Like New. Like New. book. Nº de ref. del artículo: ERICA800146127852X6
Gastos de envío:
EUR 29,37
De Reino Unido a Estados Unidos de America
Destinos, gastos y plazos de envío
Cantidad disponible: 1 disponibles