Scanning Probe Microscopy of Functional Materials: Nanoscale Imaging and Spectroscopy - Tapa dura

 
9781441965677: Scanning Probe Microscopy of Functional Materials: Nanoscale Imaging and Spectroscopy
Tapa dura
ISBN 10: 144196567X ISBN 13: 9781441965677
Editorial: Springer, 2010

Sinopsis

The goal of this book is to provide a general overview of the rapidly developing field of novel scanning probe microscopy (SPM) techniques for characterization of a wide range of functional materials, including complex oxides, biopolymers, and semiconductors.

"Sinopsis" puede pertenecer a otra edición de este libro.

Acerca del autor

Sergei Kalinin is a researcher at Oak Ridge National Laboratory. Alexei Gruverman is an associate professor at University of Nebraska-Lincoln.

De la contraportada

Novel scanning probe microscopy (SPM) techniques are used for the characterization of local materials functionalities ranging from chemical reactivity and composition to mechanical, electromechanical, and transport behaviors. In this comprehensive overview, special emphasis is placed on emerging applications of spectroscopic imaging and multifrequency SPM methods, thermomechanical characterization, ion-conductance microscopy, as well as combined SPM-mass spectrometry, SPM-patch clamp, and SPM-focused X-ray applications. By bringing together critical reviews by leading researchers on the application of SPM to the nanoscale characterization of functional materials properties, Scanning Probe Microscopy of Functional Materials provides insight into fundamental and technological advances and future trends in key areas of nanoscience and nanotechnology.Key Features:•Serves the rapidly developing field of nanoscale characterization of functional materials properties•Covers electrical, electromechanical, magnetic, and chemical properties of diverse materials including complex oxides, biopolymers, and semiconductors•Focuses on recently emerging areas such as nanoscale chemical reactions, electromechanics, spin effects, and molecular vibrations•Combines theoretical aspects with applications ranging from fundamental physical studies to device characterization

"Sobre este título" puede pertenecer a otra edición de este libro.

Editorial
Springer
Año de publicación
2010
Idioma
Inglés
ISBN 10 
144196567X
ISBN 13 
9781441965677
Encuadernación
Tapa dura
Número de páginas
576
Editor
Gruverman Alexei, Kalinin Sergei V.
Contacto del fabricante
no disponible
Persona responsable
CMN Printpool Inh. Mathis Neumann
https://www.also.com/ec/cms5/en_6000/6000/index.jsp

Friedrich-Karl-Str. 9
Hamburg
Alemania

Otras ediciones populares con el mismo título

9781493939473: Scanning Probe Microscopy of Functional Materials: Nanoscale Imaging and Spectroscopy

Edición Destacada

ISBN 10:  1493939475 ISBN 13:  9781493939473
Editorial: Springer, 2016
Tapa blanda