Transportation Statistics and Microsimulation - Tapa dura

Spiegelman, Clifford; Park, Eun Sug; Rilett, Laurence R.

 
9781439800232: Transportation Statistics and Microsimulation
Tapa dura
ISBN 10: 1439800235 ISBN 13: 9781439800232
Editorial: Chapman and Hall/CRC, 2010

Sinopsis

By discussing statistical concepts in the context of transportation planning and operations, this text provides the necessary background for making informed transportation-related decisions. It explains the why behind standard methods and uses real-world transportation examples and problems to illustrate key concepts. The book covers the statistical techniques most frequently employed by transportation and pavement professionals. To familiarize readers with the underlying theory and equations, it contains problems that can be solved using SAS’s JMP package, which enables users to interactively explore and visualize data.

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Acerca del autor

Clifford Spiegelman is a distinguished professor of statistics at Texas A&M University, where he has been for twenty-three years. Dr. Spiegelman is also a senior research scientist at the Texas Transportation Institute.

Eun Sug Park is a research scientist at the Texas Transportation Institute. Dr. Park was a recipient of the TRB Pedestrian Committee Outstanding Paper Award (2006 and 2009) and the Patricia Waller Award (2009).

Laurence R. Rilett is a distinguished professor of civil engineering at the University of Nebraska–Lincoln. He also is the director of both the U.S. Department of Transportation’s Region VII University Transportation Center and the Nebraska Transportation Center.

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Editorial
Chapman and Hall/CRC
Año de publicación
2010
Idioma
Inglés
ISBN 10 
1439800235
ISBN 13 
9781439800232
Encuadernación
Tapa dura
Número de edición
1
Número de páginas
384
Contacto del fabricante
Taylor and Francis, GPSR Taylor and Francis
gpsr@taylorandfrancis.com

Taylor & Francis Verlag GmbH, Kaufingerstraße 24
München
80331
Alemania

Otras ediciones populares con el mismo título

9781032477664: Transportation Statistics and Microsimulation

Edición Destacada

ISBN 10:  1032477660 ISBN 13:  9781032477664
Editorial: Chapman and Hall/CRC, 2023
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