High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test: 22A (Frontiers in Electronic Testing) - Tapa dura
Libro 12 de 36: Frontiers in Electronic Testing
Sinopsis
Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully.
High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author’s 20 years of experience in memory design, memory reliability development and memory self test.
High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested.
"Sinopsis" puede pertenecer a otra edición de este libro.
Críticas
From the reviews:
"Fulfilling a need in the industry and a need in the literature, the book is certain to stimulate a heightened research interest in memory test, memory design, and memory elf test, each of which by itself constitutes an intriguing subject. The observations and approaches of the book make it a most useful work for the professional and the researcher in helping them understand the memories that are being tested." (Current Engineering Practice, Vol. 47, 2002-2003)
Reseña del editor
Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully.
High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test.
High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested.
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High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test (Frontiers in Electronic Testing, 22A)
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High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test (Frontiers in Electronic Testing)
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High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test (Frontiers in Electronic Testing, 22A)
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High Performance Memory Testing
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Buch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Are memory applications more critical than they have been in the past Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested. 266 pp. Englisch. Nº de ref. del artículo: 9781402072550
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High Performance Memory Testing
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Gebunden. Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were. Nº de ref. del artículo: 4094950
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High Performance Memory Testing | Design Principles, Fault Modeling and Self-Test
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Buch. Condición: Neu. High Performance Memory Testing | Design Principles, Fault Modeling and Self-Test | R. Dean Adams | Buch | xiv | Englisch | 2002 | Copernicus | EAN 9781402072550 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu Print on Demand. Nº de ref. del artículo: 102592174
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High Performance Memory Testing
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Springer US, Springer US Sep 2002, 2002
ISBN 10: 1402072554
ISBN 13: 9781402072550
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Buch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Are memory applications more critical than they have been in the past Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully.High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test.High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 266 pp. Englisch. Nº de ref. del artículo: 9781402072550
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High Performance Memory Testing : Design Principles, Fault Modeling and Self-Test
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Springer US, Springer US, 2002
ISBN 10: 1402072554
ISBN 13: 9781402072550
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Buch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - Are memory applications more critical than they have been in the past Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested. Nº de ref. del artículo: 9781402072550
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High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test (Frontiers in Electronic Testing)
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Springer, 2002
ISBN 10: 1402072554
ISBN 13: 9781402072550
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Hardcover. Condición: New. SIGNED BY AUTHOR. Springer-Verlag New York Inc., United States, 2002. Hardcover. Condition: New. 2003 ed. Language: English. Seller Inventory # 0000019. Signed by Author(s). Nº de ref. del artículo: 0000020
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High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test (Frontiers in Electronic Testing, 22A)
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Hardcover. Condición: new. Excellent Condition.Excels in customer satisfaction, prompt replies, and quality checks. Nº de ref. del artículo: Scanned1402072554
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