Thermal Testing of Integrated Circuits - Tapa dura

Altet; Altet, Josep; Kress, Moshe

 
9781402070761: Thermal Testing of Integrated Circuits

Sinopsis

Temperature has been always considered as an appreciable magnitude to detect failures in electric systems. In this book, the authors present the feasibility of considering temperature as an observable for testing purposes, with full coverage of the state of the art.

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Reseña del editor

Temperature has been always considered as an appreciable magnitude to detect failures in electric systems. In this book, the authors present the feasibility of considering temperature as an observable for testing purposes, with full coverage of the state of the art.

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Otras ediciones populares con el mismo título

9781441952875: Thermal Testing of Integrated Circuits

Edición Destacada

ISBN 10:  144195287X ISBN 13:  9781441952875
Editorial: Springer, 2011
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