This is an overview of recording principles, materials aspects, and applications of rewritable optical storage. Elements of data recording, including mark formation, eraseability, direct overwrite strategies, data quality and data stability are explained and extensively discussed. Throughout the book, a mark formation model is described and used to back-up measurement results and support the discussed applications. High-speed and dual-layer recording are analyzed in depth, with proposals to achieve higher performance.
"Sinopsis" puede pertenecer a otra edición de este libro.
I read this book on my way back from a conference in Colorado and I wasn't happy that Silicon Valley is so close to Colorado.
Intro and 5 chapters give full good overview of optical data storage and plenty of experimental data.
Book is very useful for students and engineers (optics, material sci., mechanics) and everybody who want to know how his/her DVD or CD is working.
By
Semyon D. Savransky (Silicon Valley, California, USA)
This is an overview of recording principles, materials aspects, and applications of rewritable optical storage. Elements of data recording, including mark formation, eraseability, direct overwrite strategies, data quality and data stability are explained and extensively discussed. Throughout the book, a mark formation model is described and used to back-up measurement results and support the discussed applications. High-speed and dual-layer recording are analyzed in depth, with proposals to achieve higher performance.
"Sobre este título" puede pertenecer a otra edición de este libro.
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Librería: Biblios, Frankfurt am main, HESSE, Alemania
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Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Alemania
Buch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This is an overview of recording principles, materials aspects, and applications of rewritable optical storage. Elements of data recording, including mark formation, eraseability, direct overwrite strategies, data quality and data stability are explained and extensively discussed. Throughout the book, a mark formation model is described and used to back-up measurement results and support the discussed applications. High-speed and dual-layer recording are analyzed in depth, with proposals to achieve higher performance. 184 pp. Englisch. Nº de ref. del artículo: 9781402042164
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