Sinopsis
Excerpt from Using a Tem Cell for Emc Measurements of Electronic Equipment
Various approaches have been investigated to find ways by which to increase the test volume available in a cell without reducing its upper useful frequency. One is to design the cell with an off - set septum. Ah asymmetric or offset septum cell was fabricated as shown in the cross-sectional drawings of figure 12. The E-field distributions above and below the septum of this cell are shown in figure 13. This cell offers approximately 29% greater test volume in its lower half space than a symmetric cell of similar size with an equivalent high-frequency cutoff and resonance limitation. This additional test space, however, comes at the price of less test field uniformity and greater difficulty in using the cell at multimode frequencies. A previous publication comparing the characteristics of this cell with a symmetric cell of similar size is available for further study, if desired [8.
About the Publisher
Forgotten Books publishes hundreds of thousands of rare and classic books. Find more at www.forgottenbooks.com
This book is a reproduction of an important historical work. Forgotten Books uses state-of-the-art technology to digitally reconstruct the work, preserving the original format whilst repairing imperfections present in the aged copy. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in our edition. We do, however, repair the vast majority of imperfections successfully; any imperfections that remain are intentionally left to preserve the state of such historical works.
"Sinopsis" puede pertenecer a otra edición de este libro.
Otras ediciones populares con el mismo título
Resultados de la búsqueda para Using a Tem Cell for Emc Measurements of Electronic...
Imagen del vendedor
Using a Tem Cell for Emc Measurements of Electronic Equipment (Classic Reprint)
Impresión bajo demandaLibrería: Forgotten Books, London, Reino Unido
Calificación del vendedor: 4 de 5 estrellas
Paperback. Condición: New. Print on Demand. This book takes an in-depth look at the use of TEM cells for electromagnetic measurements of electronic equipment. Extensive step-by-step procedures are provided for using a TEM cell to perform either radiated electromagnetic susceptibility testing or for measuring radiated electromagnetic emissions from electronic/electromechanical equipment. Written by experts in the field, the book begins with a history of TEM cells and their development, then provides a detailed physical and electrical description of TEM cells and explains how to use them for both radiated susceptibility and emanation measurements. The author provides a brief error analysis associated with the measurement technique, giving the reader a clear understanding of the limitations of TEM cells. An invaluable resource for potential users of TEM cells and those who need to minimize problems often encountered when performing EMC measurements. This book is a reproduction of an important historical work, digitally reconstructed using state-of-the-art technology to preserve the original format. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in the book. print-on-demand item. Nº de ref. del artículo: 9781390511246_0
Comprar nuevo
EUR 17,03
Gastos de envío gratis
Se envía de Reino Unido a Estados Unidos de America
Se envía de Reino Unido a Estados Unidos de America
Cantidad disponible: Más de 20 disponibles