Sinopsis
Excerpt from A Product Design Problem in Semiconductor Manufacturing
Because of the complexity of the technology and the fast-changing nature of the semi conductor industry, the yield of non-defective chips in wafer fabrication can be low and very erratic. Average yield rates can vary from several percent up to eighty or ninety percent depending upon the maturity and complexity of the product. Chips are made on wafers, and wafers are produced in lots, where the lot size is typically between five and fifty. In this paper, three different possibilities for producing defective chips will be explicitly considered: an entire lot can be defective, an entire wafer in a non-defective lot can be defective, and finally an individual chip on a non-defective wafer can be defective.
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This book is a reproduction of an important historical work. Forgotten Books uses state-of-the-art technology to digitally reconstruct the work, preserving the original format whilst repairing imperfections present in the aged copy. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in our edition. We do, however, repair the vast majority of imperfections successfully; any imperfections that remain are intentionally left to preserve the state of such historical works.
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Reseña del editor
Excerpt from A Product Design Problem in Semiconductor Manufacturing
Because of the complexity of the technology and the fast-changing nature of the semi conductor industry, the yield of non-defective chips in wafer fabrication can be low and very erratic. Average yield rates can vary from several percent up to eighty or ninety percent depending upon the maturity and complexity of the product. Chips are made on wafers, and wafers are produced in lots, where the lot size is typically between five and fifty. In this paper, three different possibilities for producing defective chips will be explicitly considered: an entire lot can be defective, an entire wafer in a non-defective lot can be defective, and finally an individual chip on a non-defective wafer can be defective.
About the Publisher
Forgotten Books publishes hundreds of thousands of rare and classic books. Find more at www.forgottenbooks.com
This book is a reproduction of an important historical work. Forgotten Books uses state-of-the-art technology to digitally reconstruct the work, preserving the original format whilst repairing imperfections present in the aged copy. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in our edition. We do, however, repair the vast majority of imperfections successfully; any imperfections that remain are intentionally left to preserve the state of such historical works.
Reseña del editor
Excerpt from A Product Design Problem in Semiconductor Manufacturing
We consider the product design problem of allocating the chip sites on a semiconductor wafer to various types of chips. The manufacturing facility sells chips to its customers in sets (a specified number of several different types of chips), and the objective of the facility is to maximize the average production rate of sets. Variability in the wafer fabrication process, in particular random yield, poses a major obstacle in producing sets in a reliable fashion. A stochastic analysis is employed to develop an effective wafer design, and to measure the improvement in performance of the multi-type wafer over the traditional single-type wafer. The analysis reveals that multi-type wafers regularize the production flow of non-defective chips of each type and cause these flows to be positively correlated, both of which help to improve performance. A numerical example is provided that illustrates the analysis and demonstrates the design's effectiveness.
About the Publisher
Forgotten Books publishes hundreds of thousands of rare and classic books. Find more at www.forgottenbooks.com
This book is a reproduction of an important historical work. Forgotten Books uses state-of-the-art technology to digitally reconstruct the work, preserving the original format whilst repairing imperfections present in the aged copy. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in our edition. We do, however, repair the vast majority of imperfections successfully; any imperfections that remain are intentionally left to preserve the state of such historical works.
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A Product Design Problem in Semiconductor Manufacturing (Classic Reprint)
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Paperback. Condición: New. Print on Demand. This book tackles the intricate relationship between design and variability in semiconductor manufacturing, proposing an effective yet simple design for multi-type semiconductor wafers that outperforms traditional designs with reduced variability and improved efficiency. The author employs a nuanced understanding of stochastic analysis and mathematical programming to develop a design that enhances the flow of non-defective chips, leading to a surge in production. Through a numerical example, the book demonstrates the significant improvement in cumulative production when using the proposed multi-type wafer design, outperforming the single-type design by over 11%, and reaching up to 94% of the theoretical deterministic production rate. With its focus on practical solutions and accessible explanations, this book offers valuable insights to manufacturing professionals, engineers, and students seeking to optimize production processes in the face of variability. This book is a reproduction of an important historical work, digitally reconstructed using state-of-the-art technology to preserve the original format. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in the book. print-on-demand item. Nº de ref. del artículo: 9781332277155_0
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A Product Design Problem in Semiconductor Manufacturing (Classic Reprint)
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ISBN 13: 9781332277155
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