CompTIA PenTest+ Certification All-in-One Exam Guide, Second Edition (Exam PT0-002) - Tapa blanda

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9781264274895: CompTIA PenTest+ Certification All-in-One Exam Guide, Second Edition (Exam PT0-002)

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ISBN 10: 1264274890 ISBN 13: 9781264274895

Editorial: McGraw Hill, 2022

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This fully-updated guide delivers complete coverage of every topic on the current version of the CompTIA PenTest+ certification exam.

Get complete coverage of all the objectives included on the CompTIA PenTest+ certification exam PT0-002 from this comprehensive resource. Written by expert penetration testers, the book provides learning objectives at the beginning of each chapter, hands-on exercises, exam tips, and practice questions with in-depth explanations. Designed to help you pass the exam with ease, this definitive volume also serves as an essential on-the-job reference.

Covers all exam topics, including:

Planning and engagement
Information gathering
Vulnerability scanning
Network-based attacks
Wireless and radio frequency attacks
Web and database attacks
Cloud attacks
Specialized and fragile systems
Social Engineering and physical attacks
Post-exploitation tools and techniques
Post-engagement activities
Tools and code analysis
And more

Online content includes:

170 practice exam questions
Interactive performance-based questions
Test engine that provides full-length practice exams or customizable quizzes by chapter or exam objective

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Acerca del autor

Heather Linn, CompTIA PenTest+, has over 20 years in the security industry and has held roles in corporate security, penetration testing, and as part of a hunt team. She has served as the technical editor for CompTIA PenTest+ Certification All-in-One Exam Guide, First Edition, CompTIA PenTest+ Certification Practice Exams, and Gray Hat Hacking, Fifth Edition. She is the author of CompTIA PenTest+ Passport.

Raymond Nutting, CompTIA PenTest+™, CISSP-ISSEP, is a published author and security practitioner with over 20 years of experience in the field of information security. He is the co-owner and founder of nDepth Security, a managed security service provider that specializes in penetration testing. Ray holds numerous industry-recognized certifications and has presented at various conferences and events throughout his career.

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Editorial: McGraw Hill
A�o de publicaci�n: 2022
Idioma: Ingl�s
ISBN 10: 1264274890
ISBN 13: 9781264274895
Encuadernaci�n: Tapa blanda
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N�mero de p�ginas: 464
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CompTIA PenTest+ Certification All-in-One Exam Guide, Second Edition (Exam PT0-002)

Linn, Heather,Nutting, Raymond

Publicado por McGraw Hill, 2022

ISBN 10: 1264274890 ISBN 13: 9781264274895

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Comptia Pentest+ Certification All-in-one Exam Guide, Exam Pt0-002

Linn, Heather; Nutting, Raymond

Publicado por McGraw Hill, 2022

ISBN 10: 1264274890 ISBN 13: 9781264274895

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CompTIA PenTest+ Certification All-in-One Exam Gui Format: Paperback

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Publicado por Mcgraw Hill Publishers, 2022

ISBN 10: 1264274890 ISBN 13: 9781264274895

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Comptia Pentest+ Certification All-in-one Exam Guide, Exam Pt0-002

Linn, Heather; Nutting, Raymond

Publicado por McGraw Hill, 2022

ISBN 10: 1264274890 ISBN 13: 9781264274895

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CompTIA PenTest+ Certification All-in-One Exam Guide, Second Edition (Exam PT0-002) (Paperback)

Heather Linn

Publicado por McGraw-Hill Education, OH, 2022

ISBN 10: 1264274890 ISBN 13: 9781264274895

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Paperback. Condici�n: new. Paperback. This fully-updated guide delivers complete coverage of every topic on the current version of the CompTIA PenTest+ certification exam.Get complete coverage of all the objectives included on the CompTIA PenTest+ certification exam PT0-002 from this comprehensive resource. Written by expert penetration testers, the book provides learning objectives at the beginning of each chapter, hands-on exercises, exam tips, and practice questions with in-depth explanations. Designed to help you pass the exam with ease, this definitive volume also serves as an essential on-the-job reference.Covers all exam topics, including:Planning and engagementInformation gatheringVulnerability scanningNetwork-based attacksWireless and radio frequency attacksWeb and database attacksCloud attacksSpecialized and fragile systemsSocial Engineering and physical attacksPost-exploitation tools and techniquesPost-engagement activitiesTools and code analysisAnd moreOnline content includes:170 practice exam questionsInteractive performance-based questionsTest engine that provides full-length practice exams or customizable quizzes by chapter or exam objective Shipping may be from multiple locations in the US or from the UK, depending on stock availability. N� de ref. del art�culo: 9781264274895

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CompTIA PenTest+ Certification All-in-One Exam Guide, Second Edition (Exam PT0-002)

Raymond Nutting, Heather Linn

Publicado por McGraw-Hill Education, US, 2022

ISBN 10: 1264274890 ISBN 13: 9781264274895

Nuevo Paperback

Librería: Rarewaves USA, OSWEGO, IL, Estados Unidos de America

Calificaci�n del vendedor: 5 de 5 estrellas

Paperback. Condici�n: New. This fully-updated guide delivers complete coverage of every topic on the current version of the CompTIA PenTest+ certification exam.Get complete coverage of all the objectives included on the CompTIA PenTest+ certification exam PT0-002 from this comprehensive resource. Written by expert penetration testers, the book provides learning objectives at the beginning of each chapter, hands-on exercises, exam tips, and practice questions with in-depth explanations. Designed to help you pass the exam with ease, this definitive volume also serves as an essential on-the-job reference.Covers all exam topics, including:Planning and engagementInformation gatheringVulnerability scanningNetwork-based attacksWireless and radio frequency attacksWeb and database attacksCloud attacksSpecialized and fragile systemsSocial Engineering and physical attacksPost-exploitation tools and techniquesPost-engagement activitiesTools and code analysisAnd moreOnline content includes:170 practice exam questionsInteractive performance-based questionsTest engine that provides full-length practice exams or customizable quizzes by chapter or exam objective. N� de ref. del art�culo: LU-9781264274895

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