Optimization of a Multilayer Photothermal Sensor for Infrared Spectroscopy - Tapa blanda

Wiggins, Janine J.

 
9781249594239: Optimization of a Multilayer Photothermal Sensor for Infrared Spectroscopy
Tapa blanda
ISBN 10: 1249594235 ISBN 13: 9781249594239
Editorial: BiblioScholar, 2012

Sinopsis

Mathematical modeling and atomic force microscopy were used to optimize a multi-layer reed sensor for use in a new infrared detection system. The reed sensor is designed to deflect in response to temperature variations. In this system, a sample absorbs infrared light (modulated at some frequency to reduce noise) and releases heat into the reed. The layers expand differently, causing the reed to deflect. The deflection is influenced by geometric parameters, such as length and thickness of each layer, and also by the frequency of modulation. Deflection is easily measured using an atomic force microscope. This research applied a mathematical model to the reed sensor, explored the effect of varying geometric parameters, and used experimental testing to evaluate the model. Several reeds were tested to validate the model, which predicted sensitivity, maximum deflection, resonance frequency, and signal to noise ratio. Varying concentrations of absorbing chemical were deposited in the reed, to cause a change in deflection. A cantilever reed having three layers was modeled mathematically using a recently developed thermal model and a mechanical model based on two-layer theory.

"Sinopsis" puede pertenecer a otra edición de este libro.

Reseña del editor

Mathematical modeling and atomic force microscopy were used to optimize a multi-layer reed sensor for use in a new infrared detection system. The reed sensor is designed to deflect in response to temperature variations. In this system, a sample absorbs infrared light (modulated at some frequency to reduce noise) and releases heat into the reed. The layers expand differently, causing the reed to deflect. The deflection is influenced by geometric parameters, such as length and thickness of each layer, and also by the frequency of modulation. Deflection is easily measured using an atomic force microscope. This research applied a mathematical model to the reed sensor, explored the effect of varying geometric parameters, and used experimental testing to evaluate the model. Several reeds were tested to validate the model, which predicted sensitivity, maximum deflection, resonance frequency, and signal to noise ratio. Varying concentrations of absorbing chemical were deposited in the reed, to cause a change in deflection. A cantilever reed having three layers was modeled mathematically using a recently developed thermal model and a mechanical model based on two-layer theory.

"Sobre este título" puede pertenecer a otra edición de este libro.

Editorial
BiblioScholar
Año de publicación
2012
Idioma
Inglés
ISBN 10 
1249594235
ISBN 13 
9781249594239
Encuadernación
Tapa blanda
Número de páginas
70
Contacto del fabricante
no disponible
Persona responsable
no disponible