Handbook of Microwave Component Measurements: with Advanced VNA Techniques - Tapa dura

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Dr. Joel P. Dunsmore, Agilent Technologies, USA Since graduating from Oregon State University with a BSEE (1982) and an MSEE (1983), Joel Dunsmore has worked for Agilent Technologies (formerly Hewlett-Packard) at the Sonoma County Site. He received his Ph.D. from Leeds University in 2004. In 2008 Joel was promoted to the rank of Agilent R&D Fellow (one of six), working for the Component Test Division.

De la contraportada

This book provides state-of-the-art coverage for making measurements on RF and Microwave Components, both active and passive. A perfect reference for R&D and Test Engineers, with topics ranging from the best practices for basic measurements, to an in-depth analysis of errors, correction methods, and uncertainty analysis, this book provides everything you need to understand microwave measurements. With primary focus on active and passive measurements using a Vector Network Analyzer, these techniques and analysis are equally applicable to measurements made with Spectrum Analyzers or Noise Figure Analyzers.

The early chapters provide a theoretical basis for measurements complete with extensive definitions and descriptions of component characteristics and measurement parameters.  The latter chapters give detailed examples for cases of cable, connector and filter measurements; low noise, high-gain and high power amplifier measurements, a wide range of mixer and frequency converter measurements, and a full examination of fixturing, de-embedding, balanced measurements and calibration techniques. The chapter on time-domain theory and measurements is the most complete treatment on the subject yet presented, with details of the underlying mathematics and new material on time domain gating. As the inventor of many of the methods presented, and with 30 years as a development engineer on the most modern measurement platforms, the author presents unique insights into the understanding of modern measurement theory.

Key Features:

• Explains the interactions between the device-under-test (DUT) and the measuring equipment by demonstrating the best practices for ascertaining the true nature of the DUT, and optimizing the time to set up and measure
• Offers a detailed explanation of algorithms and mathematics behind measurements and error correction
• Provides numerous illustrations (e.g. block-diagrams for circuit connections and measurement setups) and practical examples on real-world devices, which can provide immediate benefit to the reader
• Written by the principle developer and designer of many of the measurement methods described

This book will be an invaluable guide for RF and microwave R&D and test engineers, satellite test engineers, radar engineers, power amplifier designers, LNA designers, and mixer designers. University researchers and graduate students in microwave design and test will also find this book of interest.