Artículos relacionados a Future Trends in Microelectronics: Frontiers and Innovations...

Future Trends in Microelectronics: Frontiers and Innovations (Wiley – IEEE) - Tapa dura

Luryi, Serge; Xu, Jimmy; Zaslavsky, Alexander

 
9781118442166: Future Trends in Microelectronics: Frontiers and Innovations (Wiley – IEEE)

Sinopsis

This seventh volume of Future Trends in Microelectronics summarizes and synthesizes the high-level scientific discussions from top experts in academia, industry, and government. It includes 29 contributor chapters covering everything from new physical principles (quantum computing, topological insulators) to new materials (extreme electron concentration oxides, terahertz plasmas) to emerging device technologies (embedded magnetic memories, high-performance light emitting diodes). This holistic vision of semiconductor microelectronics enables readers to move forward with research in an informed, efficient, and profitable manner.

"Sinopsis" puede pertenecer a otra edición de este libro.

Acerca del autor

SERGE LURYI is a Distinguished Professor and Chair of the Electrical and Computer Engineering Department at Stony Brook University, and Director of the New York State Center for Advanced Technology in Sensor Systems. He has published over 240 papers and has been awarded fifty-one U.S. patents. JIMMY XU is the Charles C. Tillinghast Jr. '32 University Professor of Engineering and Physics at Brown University. Previously, he was the James Ham Chair in Optoelectronics and the Nortel Chair Professor, as well as director of the Nortel Institute for Telecommunications at the University of Toronto. He is a Fellow of the AAAS, APS, Guggenheim Foundation, IEEE, and Institute of Physics. ALEX ZASLAVSKY is a Professor of Engineering and Physics at Brown University. He has published over 100 journal papers and book chapters, and co-edited seven books in the microelectronics field. He is also an editor of the Solid-State Electronics international journal.

"Sobre este título" puede pertenecer a otra edición de este libro.